JPS573039A - Automatic plate wave flaw detecting device - Google Patents

Automatic plate wave flaw detecting device

Info

Publication number
JPS573039A
JPS573039A JP7637480A JP7637480A JPS573039A JP S573039 A JPS573039 A JP S573039A JP 7637480 A JP7637480 A JP 7637480A JP 7637480 A JP7637480 A JP 7637480A JP S573039 A JPS573039 A JP S573039A
Authority
JP
Japan
Prior art keywords
incident angle
echo intensity
back echo
maximum value
crt6
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7637480A
Other languages
Japanese (ja)
Inventor
Mamoru Akiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP7637480A priority Critical patent/JPS573039A/en
Publication of JPS573039A publication Critical patent/JPS573039A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4463—Signal correction, e.g. distance amplitude correction [DAC], distance gain size [DGS], noise filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2487—Directing probes, e.g. angle probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/48—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by amplitude comparison
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/056—Angular incidence, angular propagation

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To obtain the same flaw detection accuracy despite fluctuations in line conditions by setting the incident angle of a probe with a computer in such a manner as to maximize back echo intensity, and making the back echo intensity of that time gain 100% on a CRT. CONSTITUTION:The incident angle of a probe 1 is regulated by using an incident angle setter 17 by the command of a microcomputer 13. The maximum value of the back echo intensity is renewed at every one image plane of the display of a CRT6 while an optimum incident angle is being determined, and when the incident angle is so large that the back echo intensity lowers, the incident angle is decreased, whereby the maximum value of the back echo intensity is detected. When the maximum value of the back echo intensity is detected, an automatic sensitivity corrector 16 is operated and the gain of the corrector 16 is so regulated by the microcomputer 13 that the back echo intensity on the CRT6 attains 100%. When in this state the defect echo exceeding the detect gate level of a defect level setter 15 is received by a transmitting and receiving unit 14, data are made in a data processing part 7.
JP7637480A 1980-06-06 1980-06-06 Automatic plate wave flaw detecting device Pending JPS573039A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7637480A JPS573039A (en) 1980-06-06 1980-06-06 Automatic plate wave flaw detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7637480A JPS573039A (en) 1980-06-06 1980-06-06 Automatic plate wave flaw detecting device

Publications (1)

Publication Number Publication Date
JPS573039A true JPS573039A (en) 1982-01-08

Family

ID=13603565

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7637480A Pending JPS573039A (en) 1980-06-06 1980-06-06 Automatic plate wave flaw detecting device

Country Status (1)

Country Link
JP (1) JPS573039A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60233547A (en) * 1982-06-24 1985-11-20 アルミニウム　カンパニ−　オブ　アメリカ Method and device for maintaining parallel relationship between working surface of acoustic transducer and flat surface of object

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52119381A (en) * 1976-03-31 1977-10-06 Sumitomo Metal Ind Method of setting sensitivity of ultrasonic flaw detector
JPS5325484A (en) * 1976-08-20 1978-03-09 Tokyo Keiki Kk Lamb wave flaw detector

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52119381A (en) * 1976-03-31 1977-10-06 Sumitomo Metal Ind Method of setting sensitivity of ultrasonic flaw detector
JPS5325484A (en) * 1976-08-20 1978-03-09 Tokyo Keiki Kk Lamb wave flaw detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60233547A (en) * 1982-06-24 1985-11-20 アルミニウム　カンパニ−　オブ　アメリカ Method and device for maintaining parallel relationship between working surface of acoustic transducer and flat surface of object

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