JPS57207347A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS57207347A
JPS57207347A JP9327881A JP9327881A JPS57207347A JP S57207347 A JPS57207347 A JP S57207347A JP 9327881 A JP9327881 A JP 9327881A JP 9327881 A JP9327881 A JP 9327881A JP S57207347 A JPS57207347 A JP S57207347A
Authority
JP
Japan
Prior art keywords
circuit
test
terminal
terminals
malfunction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9327881A
Other languages
Japanese (ja)
Inventor
Yoshiaki Hayasaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP9327881A priority Critical patent/JPS57207347A/en
Publication of JPS57207347A publication Critical patent/JPS57207347A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To remarkably improve malfunction detecting rate for facilitation and acceleration of a test performance, by incorporating test circuits constituted of microcomputers or components thereof into an IC circuit. CONSTITUTION:When the terminal CST of external terminals 4 in a circuit 3 for testing is reduced to low level by drive signal to enable the test circuit 2, the microcomputer starts to execute automatically the test pattern stored in an ROM24 for supplying test signal through a control circuit 26 to the circuit 3. The output of the circuit 3 is decided 27 to store the information which indicates the result and malfunction points into an RAM25 outputted to another terminal 4 after the test. A logical circuit 22 successively executes instructions previously contained in the ROM to decide timing control to the circuit 3 and malfunction points. The test result is outputted in parallel to one external terminal 4. The terminal CST is enhanced to high level not to operate the circuit 2 for the actual use of the circuit 3. When the terminals 4 are provided with test circuit control terminals, instruction and test patterns can be added to the RAM.
JP9327881A 1981-06-16 1981-06-16 Semiconductor device Pending JPS57207347A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9327881A JPS57207347A (en) 1981-06-16 1981-06-16 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9327881A JPS57207347A (en) 1981-06-16 1981-06-16 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS57207347A true JPS57207347A (en) 1982-12-20

Family

ID=14077964

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9327881A Pending JPS57207347A (en) 1981-06-16 1981-06-16 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS57207347A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810853A (en) * 1981-07-13 1983-01-21 Nec Corp Integrated circuit
JPS601839A (en) * 1983-06-20 1985-01-08 Nec Corp Integrated circuit
JPS60108937A (en) * 1983-10-14 1985-06-14 フィリップス　エレクトロニクス　ネムローゼ　フェンノートシャップ Superlarge-scale integrated circuit
JPS645031A (en) * 1987-06-26 1989-01-10 Nippon Electric Ic Microcomput Gate array type semiconductor integrated circuit
EP0352910A2 (en) * 1988-07-28 1990-01-31 Digital Equipment Corporation Finding faults in circuit boards
JPH03500099A (en) * 1987-08-26 1991-01-10 シーメンス、アクチエンゲゼルシヤフト Apparatus and method for checking and locating defective circuits in memory modules
JPH04152543A (en) * 1990-10-16 1992-05-26 Agency Of Ind Science & Technol Integrated circuit structure body provided with self-inspection function; sorting method of good integrated circuit chip by using it
JPH04170065A (en) * 1990-11-02 1992-06-17 Nec Ic Microcomput Syst Ltd Semiconductor integrated circuit
JPH06342040A (en) * 1990-08-31 1994-12-13 Internatl Business Mach Corp <Ibm> On chip self-checking arrangement for vlsi circuit and built-in (on-chip) self-checking device for vlsi memory circuit
US6934884B1 (en) 1999-05-11 2005-08-23 Sharp Kabushiki Kaisha One-chip microcomputer and control method thereof as well as an IC card having such a one-chip microcomputer

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5247682A (en) * 1975-10-15 1977-04-15 Toshiba Corp Integrated circuit
JPS5372538A (en) * 1976-12-10 1978-06-28 Nec Corp Test unit for dynamic processor element
JPS5488084A (en) * 1977-12-26 1979-07-12 Fujitsu Ltd Test method of semiconductor device
JPS5537634A (en) * 1978-09-06 1980-03-15 Nec Corp Integrated-circuit device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5247682A (en) * 1975-10-15 1977-04-15 Toshiba Corp Integrated circuit
JPS5372538A (en) * 1976-12-10 1978-06-28 Nec Corp Test unit for dynamic processor element
JPS5488084A (en) * 1977-12-26 1979-07-12 Fujitsu Ltd Test method of semiconductor device
JPS5537634A (en) * 1978-09-06 1980-03-15 Nec Corp Integrated-circuit device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5810853A (en) * 1981-07-13 1983-01-21 Nec Corp Integrated circuit
JPS601839A (en) * 1983-06-20 1985-01-08 Nec Corp Integrated circuit
JPS60108937A (en) * 1983-10-14 1985-06-14 フィリップス　エレクトロニクス　ネムローゼ　フェンノートシャップ Superlarge-scale integrated circuit
JPS645031A (en) * 1987-06-26 1989-01-10 Nippon Electric Ic Microcomput Gate array type semiconductor integrated circuit
JPH03500099A (en) * 1987-08-26 1991-01-10 シーメンス、アクチエンゲゼルシヤフト Apparatus and method for checking and locating defective circuits in memory modules
EP0352910A2 (en) * 1988-07-28 1990-01-31 Digital Equipment Corporation Finding faults in circuit boards
JPH06342040A (en) * 1990-08-31 1994-12-13 Internatl Business Mach Corp <Ibm> On chip self-checking arrangement for vlsi circuit and built-in (on-chip) self-checking device for vlsi memory circuit
JPH04152543A (en) * 1990-10-16 1992-05-26 Agency Of Ind Science & Technol Integrated circuit structure body provided with self-inspection function; sorting method of good integrated circuit chip by using it
JPH04170065A (en) * 1990-11-02 1992-06-17 Nec Ic Microcomput Syst Ltd Semiconductor integrated circuit
US6934884B1 (en) 1999-05-11 2005-08-23 Sharp Kabushiki Kaisha One-chip microcomputer and control method thereof as well as an IC card having such a one-chip microcomputer

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