JPS5783858A - Diagnosing device - Google Patents

Diagnosing device

Info

Publication number
JPS5783858A
JPS5783858A JP55159156A JP15915680A JPS5783858A JP S5783858 A JPS5783858 A JP S5783858A JP 55159156 A JP55159156 A JP 55159156A JP 15915680 A JP15915680 A JP 15915680A JP S5783858 A JPS5783858 A JP S5783858A
Authority
JP
Japan
Prior art keywords
scan
circuit
diagnosis
compares
diagnosed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55159156A
Other languages
Japanese (ja)
Inventor
Hitoshi Ikeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55159156A priority Critical patent/JPS5783858A/en
Publication of JPS5783858A publication Critical patent/JPS5783858A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To ensure the control of diagnosis in a high speed, by simplifying the constitution of a diagnosing device which compares the scan-out value of the internal state of the device to be diagnosed with the expected value. CONSTITUTION:A memory 3 consists of the bit that has the 1:1 correspondence to each scan-out point of a device 1 to be diagnosed and stores the scan-out point to each test during the diagnosis. The address of the memory 3 is held in an address register 4. Then the scan-out data given from the device 1 is counted by a counter circuit 11, and a comparator 12 compares the output of the circuit 11, and a comparator 12 compares the output of the circuit 11 with the expected value during the diagnosis. When no coincidence is obtained through the comparison, the interruption single is transmitted to an external diagnosing controller via a control circuit 13.
JP55159156A 1980-11-11 1980-11-11 Diagnosing device Pending JPS5783858A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55159156A JPS5783858A (en) 1980-11-11 1980-11-11 Diagnosing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55159156A JPS5783858A (en) 1980-11-11 1980-11-11 Diagnosing device

Publications (1)

Publication Number Publication Date
JPS5783858A true JPS5783858A (en) 1982-05-25

Family

ID=15687485

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55159156A Pending JPS5783858A (en) 1980-11-11 1980-11-11 Diagnosing device

Country Status (1)

Country Link
JP (1) JPS5783858A (en)

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