JPS5488084A - Test method of semiconductor device - Google Patents
Test method of semiconductor deviceInfo
- Publication number
- JPS5488084A JPS5488084A JP15678777A JP15678777A JPS5488084A JP S5488084 A JPS5488084 A JP S5488084A JP 15678777 A JP15678777 A JP 15678777A JP 15678777 A JP15678777 A JP 15678777A JP S5488084 A JPS5488084 A JP S5488084A
- Authority
- JP
- Japan
- Prior art keywords
- write
- tester
- readout
- bit
- address
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE: To test LSI with extremely simple measuring unit, by preparing the momory of several bits enabling to write in and readout at a part of the semiconductor chip in advance.
CONSTITUTION: The memory 21 enabling write-in and readout is inserted at the space outside the circuit pattern 12. For example, the address input terminals 22-1 and 22-2 and the input and output terminal 23 in 2-bit are available. The driving power supply is in common use with the pattern 12. The address region of 22 ways can be desingated with the address input terminal in 2-bit. One address region displays the circuit functional module, and the types of module is discriminated and displayed at the terminal 23 by designating it. The discrimination and display is detected with the tester. Test is conducted through the measurimg pad 13 and when the ranking is determined, write-in is made to other addresses through the write-in range of tester, and this ranked data are read out with the readout transistor as required, and the entire can be processed electrically while coupling one tester to the chip.
COPYRIGHT: (C)1979,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52156787A JPS6047745B2 (en) | 1977-12-26 | 1977-12-26 | Testing method for semiconductor devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP52156787A JPS6047745B2 (en) | 1977-12-26 | 1977-12-26 | Testing method for semiconductor devices |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5488084A true JPS5488084A (en) | 1979-07-12 |
JPS6047745B2 JPS6047745B2 (en) | 1985-10-23 |
Family
ID=15635292
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52156787A Expired JPS6047745B2 (en) | 1977-12-26 | 1977-12-26 | Testing method for semiconductor devices |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6047745B2 (en) |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS565021U (en) * | 1979-06-20 | 1981-01-17 | ||
JPS5690269A (en) * | 1979-12-25 | 1981-07-22 | Toshiba Corp | Measuring method for semiconductor integrated circuit |
JPS5727042A (en) * | 1980-07-25 | 1982-02-13 | Hitachi Ltd | Inspecting method for wafer |
JPS5771166A (en) * | 1980-10-22 | 1982-05-01 | Nec Corp | Semiconductor device |
JPS5793520A (en) * | 1980-12-02 | 1982-06-10 | Nec Corp | Semiconductor device |
JPS57207347A (en) * | 1981-06-16 | 1982-12-20 | Mitsubishi Electric Corp | Semiconductor device |
JPS58106842A (en) * | 1981-12-18 | 1983-06-25 | Matsushita Electric Ind Co Ltd | Semiconductor substrate and processing method thereof |
JPS58121639A (en) * | 1981-09-14 | 1983-07-20 | シ−ク・テクノロジイ・インコ−ポレ−テツド | Product, method and device for encoding programming information in semiconductor |
JPS58169924A (en) * | 1982-03-30 | 1983-10-06 | Fujitsu Ltd | Test device for ic wafer |
JPS5923540A (en) * | 1982-07-30 | 1984-02-07 | Sharp Corp | Testing method for integrated circuit |
JPS5961056A (en) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Semiconductor chip |
JPS601839A (en) * | 1983-06-20 | 1985-01-08 | Nec Corp | Integrated circuit |
JPS61198711A (en) * | 1985-02-28 | 1986-09-03 | Toshiba Corp | Semiconductor integrated circuit device |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6156344U (en) * | 1984-09-19 | 1986-04-15 | ||
JPS62128393A (en) * | 1985-11-29 | 1987-06-10 | オムロン株式会社 | Pamphlet processor |
JPH0299366A (en) * | 1988-10-07 | 1990-04-11 | Canon Inc | Paper feeder |
JPH04135529U (en) * | 1991-06-05 | 1992-12-16 | 富士通機電株式会社 | Media feeding/separation mechanism |
-
1977
- 1977-12-26 JP JP52156787A patent/JPS6047745B2/en not_active Expired
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS565021U (en) * | 1979-06-20 | 1981-01-17 | ||
JPS6228567B2 (en) * | 1979-12-25 | 1987-06-22 | Tokyo Shibaura Electric Co | |
JPS5690269A (en) * | 1979-12-25 | 1981-07-22 | Toshiba Corp | Measuring method for semiconductor integrated circuit |
JPS5727042A (en) * | 1980-07-25 | 1982-02-13 | Hitachi Ltd | Inspecting method for wafer |
JPS5771166A (en) * | 1980-10-22 | 1982-05-01 | Nec Corp | Semiconductor device |
JPS5793520A (en) * | 1980-12-02 | 1982-06-10 | Nec Corp | Semiconductor device |
JPS57207347A (en) * | 1981-06-16 | 1982-12-20 | Mitsubishi Electric Corp | Semiconductor device |
JPS58121639A (en) * | 1981-09-14 | 1983-07-20 | シ−ク・テクノロジイ・インコ−ポレ−テツド | Product, method and device for encoding programming information in semiconductor |
JPS58106842A (en) * | 1981-12-18 | 1983-06-25 | Matsushita Electric Ind Co Ltd | Semiconductor substrate and processing method thereof |
JPS6152571B2 (en) * | 1981-12-18 | 1986-11-13 | Matsushita Electric Ind Co Ltd | |
JPS58169924A (en) * | 1982-03-30 | 1983-10-06 | Fujitsu Ltd | Test device for ic wafer |
JPS5923540A (en) * | 1982-07-30 | 1984-02-07 | Sharp Corp | Testing method for integrated circuit |
JPS5961056A (en) * | 1982-09-30 | 1984-04-07 | Fujitsu Ltd | Semiconductor chip |
JPS601839A (en) * | 1983-06-20 | 1985-01-08 | Nec Corp | Integrated circuit |
JPS61198711A (en) * | 1985-02-28 | 1986-09-03 | Toshiba Corp | Semiconductor integrated circuit device |
Also Published As
Publication number | Publication date |
---|---|
JPS6047745B2 (en) | 1985-10-23 |
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