JPS5488084A - Test method of semiconductor device - Google Patents

Test method of semiconductor device

Info

Publication number
JPS5488084A
JPS5488084A JP15678777A JP15678777A JPS5488084A JP S5488084 A JPS5488084 A JP S5488084A JP 15678777 A JP15678777 A JP 15678777A JP 15678777 A JP15678777 A JP 15678777A JP S5488084 A JPS5488084 A JP S5488084A
Authority
JP
Japan
Prior art keywords
write
tester
readout
bit
address
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15678777A
Other languages
Japanese (ja)
Other versions
JPS6047745B2 (en
Inventor
Hiromichi Asaoka
Kazuyuki Takano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP52156787A priority Critical patent/JPS6047745B2/en
Publication of JPS5488084A publication Critical patent/JPS5488084A/en
Publication of JPS6047745B2 publication Critical patent/JPS6047745B2/en
Expired legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE: To test LSI with extremely simple measuring unit, by preparing the momory of several bits enabling to write in and readout at a part of the semiconductor chip in advance.
CONSTITUTION: The memory 21 enabling write-in and readout is inserted at the space outside the circuit pattern 12. For example, the address input terminals 22-1 and 22-2 and the input and output terminal 23 in 2-bit are available. The driving power supply is in common use with the pattern 12. The address region of 22 ways can be desingated with the address input terminal in 2-bit. One address region displays the circuit functional module, and the types of module is discriminated and displayed at the terminal 23 by designating it. The discrimination and display is detected with the tester. Test is conducted through the measurimg pad 13 and when the ranking is determined, write-in is made to other addresses through the write-in range of tester, and this ranked data are read out with the readout transistor as required, and the entire can be processed electrically while coupling one tester to the chip.
COPYRIGHT: (C)1979,JPO&Japio
JP52156787A 1977-12-26 1977-12-26 Testing method for semiconductor devices Expired JPS6047745B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52156787A JPS6047745B2 (en) 1977-12-26 1977-12-26 Testing method for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52156787A JPS6047745B2 (en) 1977-12-26 1977-12-26 Testing method for semiconductor devices

Publications (2)

Publication Number Publication Date
JPS5488084A true JPS5488084A (en) 1979-07-12
JPS6047745B2 JPS6047745B2 (en) 1985-10-23

Family

ID=15635292

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52156787A Expired JPS6047745B2 (en) 1977-12-26 1977-12-26 Testing method for semiconductor devices

Country Status (1)

Country Link
JP (1) JPS6047745B2 (en)

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS565021U (en) * 1979-06-20 1981-01-17
JPS5690269A (en) * 1979-12-25 1981-07-22 Toshiba Corp Measuring method for semiconductor integrated circuit
JPS5727042A (en) * 1980-07-25 1982-02-13 Hitachi Ltd Inspecting method for wafer
JPS5771166A (en) * 1980-10-22 1982-05-01 Nec Corp Semiconductor device
JPS5793520A (en) * 1980-12-02 1982-06-10 Nec Corp Semiconductor device
JPS57207347A (en) * 1981-06-16 1982-12-20 Mitsubishi Electric Corp Semiconductor device
JPS58106842A (en) * 1981-12-18 1983-06-25 Matsushita Electric Ind Co Ltd Semiconductor substrate and processing method thereof
JPS58121639A (en) * 1981-09-14 1983-07-20 シ−ク・テクノロジイ・インコ−ポレ−テツド Product, method and device for encoding programming information in semiconductor
JPS58169924A (en) * 1982-03-30 1983-10-06 Fujitsu Ltd Test device for ic wafer
JPS5923540A (en) * 1982-07-30 1984-02-07 Sharp Corp Testing method for integrated circuit
JPS5961056A (en) * 1982-09-30 1984-04-07 Fujitsu Ltd Semiconductor chip
JPS601839A (en) * 1983-06-20 1985-01-08 Nec Corp Integrated circuit
JPS61198711A (en) * 1985-02-28 1986-09-03 Toshiba Corp Semiconductor integrated circuit device

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6156344U (en) * 1984-09-19 1986-04-15
JPS62128393A (en) * 1985-11-29 1987-06-10 オムロン株式会社 Pamphlet processor
JPH0299366A (en) * 1988-10-07 1990-04-11 Canon Inc Paper feeder
JPH04135529U (en) * 1991-06-05 1992-12-16 富士通機電株式会社 Media feeding/separation mechanism

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS565021U (en) * 1979-06-20 1981-01-17
JPS6228567B2 (en) * 1979-12-25 1987-06-22 Tokyo Shibaura Electric Co
JPS5690269A (en) * 1979-12-25 1981-07-22 Toshiba Corp Measuring method for semiconductor integrated circuit
JPS5727042A (en) * 1980-07-25 1982-02-13 Hitachi Ltd Inspecting method for wafer
JPS5771166A (en) * 1980-10-22 1982-05-01 Nec Corp Semiconductor device
JPS5793520A (en) * 1980-12-02 1982-06-10 Nec Corp Semiconductor device
JPS57207347A (en) * 1981-06-16 1982-12-20 Mitsubishi Electric Corp Semiconductor device
JPS58121639A (en) * 1981-09-14 1983-07-20 シ−ク・テクノロジイ・インコ−ポレ−テツド Product, method and device for encoding programming information in semiconductor
JPS58106842A (en) * 1981-12-18 1983-06-25 Matsushita Electric Ind Co Ltd Semiconductor substrate and processing method thereof
JPS6152571B2 (en) * 1981-12-18 1986-11-13 Matsushita Electric Ind Co Ltd
JPS58169924A (en) * 1982-03-30 1983-10-06 Fujitsu Ltd Test device for ic wafer
JPS5923540A (en) * 1982-07-30 1984-02-07 Sharp Corp Testing method for integrated circuit
JPS5961056A (en) * 1982-09-30 1984-04-07 Fujitsu Ltd Semiconductor chip
JPS601839A (en) * 1983-06-20 1985-01-08 Nec Corp Integrated circuit
JPS61198711A (en) * 1985-02-28 1986-09-03 Toshiba Corp Semiconductor integrated circuit device

Also Published As

Publication number Publication date
JPS6047745B2 (en) 1985-10-23

Similar Documents

Publication Publication Date Title
JPS5488084A (en) Test method of semiconductor device
JPS55146700A (en) Infinitesimal electronic memory circuit and method of testing same
JPS647635A (en) Semiconductor integrated circuit device with gate array and memory
MY102152A (en) Semiconductor memory device
JPS5786179A (en) Random access memory device
KR880009304A (en) EPROM built-in microcomputer
US4820974A (en) Method for measuring a characteristic of semiconductor memory device
GB1358935A (en) Complex electronic system
JPS56169292A (en) Storage device
KR970703035A (en) A method and apparatus for testing a memory circuit with parallel block write operation
KR960012497A (en) Semiconductor integrated circuit
JPS5565162A (en) Wafer prober
JPS573299A (en) Memory integrated circuit
JPS55163697A (en) Memory device
JPS57103187A (en) Semiconductor storage element
JPS5444480A (en) Package for integrated circuit
EP0398357A3 (en) Test circuit in semiconductor memory device
JPS5589998A (en) Data input unit
JPS5552953A (en) Signal observer
JPS5794995A (en) Memory test system
JPS6117142B2 (en)
JPS5479534A (en) Ic test equipment
JPS54122945A (en) Memory circuit
JPS58171844A (en) Method for semiconductor memory test
JPS55108992A (en) Semiconductor memory device