JPS5372538A - Test unit for dynamic processor element - Google Patents
Test unit for dynamic processor elementInfo
- Publication number
- JPS5372538A JPS5372538A JP14887176A JP14887176A JPS5372538A JP S5372538 A JPS5372538 A JP S5372538A JP 14887176 A JP14887176 A JP 14887176A JP 14887176 A JP14887176 A JP 14887176A JP S5372538 A JPS5372538 A JP S5372538A
- Authority
- JP
- Japan
- Prior art keywords
- test unit
- processor element
- dynamic processor
- dynamic
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:To secure an easy test for a package or the element itself incorporating a dynamic processor, by adding some auxiliary circuits to a low-speed test unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14887176A JPS5372538A (en) | 1976-12-10 | 1976-12-10 | Test unit for dynamic processor element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14887176A JPS5372538A (en) | 1976-12-10 | 1976-12-10 | Test unit for dynamic processor element |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5372538A true JPS5372538A (en) | 1978-06-28 |
Family
ID=15462578
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14887176A Pending JPS5372538A (en) | 1976-12-10 | 1976-12-10 | Test unit for dynamic processor element |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5372538A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53121575A (en) * | 1977-03-31 | 1978-10-24 | Toshiba Corp | Semiconductor device |
JPS57207347A (en) * | 1981-06-16 | 1982-12-20 | Mitsubishi Electric Corp | Semiconductor device |
-
1976
- 1976-12-10 JP JP14887176A patent/JPS5372538A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53121575A (en) * | 1977-03-31 | 1978-10-24 | Toshiba Corp | Semiconductor device |
JPS6152570B2 (en) * | 1977-03-31 | 1986-11-13 | Tokyo Shibaura Electric Co | |
JPS57207347A (en) * | 1981-06-16 | 1982-12-20 | Mitsubishi Electric Corp | Semiconductor device |
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