JPS57200865A - Structure of contact adapter for printed board continuity tester - Google Patents
Structure of contact adapter for printed board continuity testerInfo
- Publication number
- JPS57200865A JPS57200865A JP56086405A JP8640581A JPS57200865A JP S57200865 A JPS57200865 A JP S57200865A JP 56086405 A JP56086405 A JP 56086405A JP 8640581 A JP8640581 A JP 8640581A JP S57200865 A JPS57200865 A JP S57200865A
- Authority
- JP
- Japan
- Prior art keywords
- adapter
- printed board
- contact probe
- hole
- grid pitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56086405A JPS57200865A (en) | 1981-06-04 | 1981-06-04 | Structure of contact adapter for printed board continuity tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56086405A JPS57200865A (en) | 1981-06-04 | 1981-06-04 | Structure of contact adapter for printed board continuity tester |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57200865A true JPS57200865A (en) | 1982-12-09 |
JPH0210386B2 JPH0210386B2 (zh) | 1990-03-07 |
Family
ID=13885949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56086405A Granted JPS57200865A (en) | 1981-06-04 | 1981-06-04 | Structure of contact adapter for printed board continuity tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57200865A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59107200U (ja) * | 1983-01-07 | 1984-07-19 | パイオニア株式会社 | 基板アセンブリ検査装置の触針接触機構 |
-
1981
- 1981-06-04 JP JP56086405A patent/JPS57200865A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59107200U (ja) * | 1983-01-07 | 1984-07-19 | パイオニア株式会社 | 基板アセンブリ検査装置の触針接触機構 |
Also Published As
Publication number | Publication date |
---|---|
JPH0210386B2 (zh) | 1990-03-07 |
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