JPS57196166A - Voltage measurement device - Google Patents

Voltage measurement device

Info

Publication number
JPS57196166A
JPS57196166A JP56082278A JP8227881A JPS57196166A JP S57196166 A JPS57196166 A JP S57196166A JP 56082278 A JP56082278 A JP 56082278A JP 8227881 A JP8227881 A JP 8227881A JP S57196166 A JPS57196166 A JP S57196166A
Authority
JP
Japan
Prior art keywords
single crystal
output
electrodes
linbo3
faces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56082278A
Other languages
Japanese (ja)
Other versions
JPH0260985B2 (en
Inventor
Tetsuo Taniuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56082278A priority Critical patent/JPS57196166A/en
Publication of JPS57196166A publication Critical patent/JPS57196166A/en
Publication of JPH0260985B2 publication Critical patent/JPH0260985B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G01R15/241Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
    • G01R15/242Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/03Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on ceramics or electro-optical crystals, e.g. exhibiting Pockels effect or Kerr effect
    • G02F1/0305Constructional arrangements

Abstract

PURPOSE:To make it possible to completely eliminate irregular variation in optical output due to change in temperature by connecting conductive films provided on the Z faces of individual electro-optical crystals. CONSTITUTION:The Z face of a single crystal 1 of LiNbO3 is provided with transparent electrodes 7 and 7', and those transparent electrodes 7 and 7' are mutually connected electrically by a gold lead wire 8. On the other hand for the single crystal 1 that is cut in the direction perpendicular to the Z direction an electric field from electrodes 3 and 3' is applied in the direction of the X axis and when a laser light 2 is passed in the direction that is parallel to the Z axis through a deflector 4, the intensity of output of the laser light 2 that is output from the single crystal 1 through a 1/4 wave length plate 6 and a light detection element 5 varies in accordance with the applied voltage that is applied to the single crystal. Accordingly voltage is measured by this intensity of output. In this way in which the electrodes 7 and 7' are electrically connected, electric charges generated by change in temperature of the Z faces of a single crystal of LiNbO3 can be mutually nullified, and thereby generation of electric field that causes error in the measurement due to electric charge can be prevented.
JP56082278A 1981-05-28 1981-05-28 Voltage measurement device Granted JPS57196166A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56082278A JPS57196166A (en) 1981-05-28 1981-05-28 Voltage measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56082278A JPS57196166A (en) 1981-05-28 1981-05-28 Voltage measurement device

Publications (2)

Publication Number Publication Date
JPS57196166A true JPS57196166A (en) 1982-12-02
JPH0260985B2 JPH0260985B2 (en) 1990-12-18

Family

ID=13770029

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56082278A Granted JPS57196166A (en) 1981-05-28 1981-05-28 Voltage measurement device

Country Status (1)

Country Link
JP (1) JPS57196166A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60257325A (en) * 1984-06-05 1985-12-19 Yokogawa Hokushin Electric Corp Photovoltage sensor
FR2620277A1 (en) * 1987-09-09 1989-03-10 Ferranti Int Signal OPTICAL MODULATOR
EP0324611A2 (en) * 1988-01-14 1989-07-19 Ngk Insulators, Ltd. Optical unit including electrooptical crystal elements
JPH03202810A (en) * 1989-12-29 1991-09-04 Fujitsu Ltd Optical waveguide device and production thereof
WO2003038484A1 (en) * 2001-11-01 2003-05-08 Mitsubishi Denki Kabushiki Kaisha Wave length plate, wavelength filter and wavelength monitor
JP2014504726A (en) * 2011-01-21 2014-02-24 パワーセンス・アクティーゼルスカブ AC or DC power transmission system and method for measuring voltage
CN110703467A (en) * 2019-10-15 2020-01-17 中国电力科学研究院有限公司 Crystal heat dissipation structure for temperature drift suppression of electro-optic modulator and manufacturing method

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60257325A (en) * 1984-06-05 1985-12-19 Yokogawa Hokushin Electric Corp Photovoltage sensor
USRE35240E (en) * 1987-09-09 1996-05-14 Gec-Marconi Avionics (Holdings) Limited Optical modulators
FR2620277A1 (en) * 1987-09-09 1989-03-10 Ferranti Int Signal OPTICAL MODULATOR
DE3829747A1 (en) * 1987-09-09 1989-03-23 Ferranti Int Signal OPTICAL MODULATOR
DE3829747C2 (en) * 1987-09-09 1999-05-06 Ferranti Int Plc Optical quality switch
EP0324611A2 (en) * 1988-01-14 1989-07-19 Ngk Insulators, Ltd. Optical unit including electrooptical crystal elements
US4976517A (en) * 1988-01-14 1990-12-11 Ngk Insulators, Ltd. Optical unit including electrooptical crystal elements
JPH03202810A (en) * 1989-12-29 1991-09-04 Fujitsu Ltd Optical waveguide device and production thereof
WO2003038484A1 (en) * 2001-11-01 2003-05-08 Mitsubishi Denki Kabushiki Kaisha Wave length plate, wavelength filter and wavelength monitor
EP1441242A1 (en) * 2001-11-01 2004-07-28 Mitsubishi Denki Kabushiki Kaisha WAVE LENGTH PLATE, WAVELENGTH FILTER AND WAVELENGTH MONITOR
US7239654B2 (en) 2001-11-01 2007-07-03 Mitsubishi Denki Kabushiki Kaisha Wave length plate, wavelength filter and wavelength monitor
EP1441242A4 (en) * 2001-11-01 2007-10-03 Mitsubishi Electric Corp Wave length plate, wavelength filter and wavelength monitor
JP2014504726A (en) * 2011-01-21 2014-02-24 パワーセンス・アクティーゼルスカブ AC or DC power transmission system and method for measuring voltage
CN110703467A (en) * 2019-10-15 2020-01-17 中国电力科学研究院有限公司 Crystal heat dissipation structure for temperature drift suppression of electro-optic modulator and manufacturing method

Also Published As

Publication number Publication date
JPH0260985B2 (en) 1990-12-18

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