JPS57188864A - Semiconductor memory device - Google Patents
Semiconductor memory deviceInfo
- Publication number
- JPS57188864A JPS57188864A JP56073496A JP7349681A JPS57188864A JP S57188864 A JPS57188864 A JP S57188864A JP 56073496 A JP56073496 A JP 56073496A JP 7349681 A JP7349681 A JP 7349681A JP S57188864 A JPS57188864 A JP S57188864A
- Authority
- JP
- Japan
- Prior art keywords
- resistance element
- memory cell
- resistance
- layer
- poly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Abstract
PURPOSE:To easily manufacture a high resistance element with smaller occupied space without increasing the number of manufacturing processes by a device wherein respective sections of a memory cell is additionally formed in other positions and these additional regions are serially connected to form the resistance element. CONSTITUTION:In a memory cell 2 for a RAM, respective components of a resistance element 1 are formed in the same processes as those of a memory cell 2. The resistance element 1 comprises an N<-> type diffusion resistance region 4 which is formed on a P type substrate 1 through diffusion an upper poly-Si resistance layer 5 and a lower poly-Si resistance layer 6, which are serially connected to form a serial resistance. These regions 4, 5 and 6 are formed together with an N<+> type diffusion layer 7 (bit line) of the memory cell 2, a poly- Si gate 8 connected to a word line and a lower poly-Si layer 9 seriving as one electrode of a capacitor, respectively. By so doing, the high resistance element can be manufactured without increasing the number of manufacturing processes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56073496A JPS57188864A (en) | 1981-05-18 | 1981-05-18 | Semiconductor memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56073496A JPS57188864A (en) | 1981-05-18 | 1981-05-18 | Semiconductor memory device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57188864A true JPS57188864A (en) | 1982-11-19 |
Family
ID=13519917
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56073496A Pending JPS57188864A (en) | 1981-05-18 | 1981-05-18 | Semiconductor memory device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57188864A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60189965A (en) * | 1984-02-17 | 1985-09-27 | インテル・コーポレーシヨン | Metal-oxide film-semiconductor (mos) memory |
US6166425A (en) * | 1997-07-16 | 2000-12-26 | Nec Corporation | Semiconductor device having a resistance element with a reduced area |
-
1981
- 1981-05-18 JP JP56073496A patent/JPS57188864A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60189965A (en) * | 1984-02-17 | 1985-09-27 | インテル・コーポレーシヨン | Metal-oxide film-semiconductor (mos) memory |
US6166425A (en) * | 1997-07-16 | 2000-12-26 | Nec Corporation | Semiconductor device having a resistance element with a reduced area |
KR100297148B1 (en) * | 1997-07-16 | 2001-08-07 | 가네꼬 히사시 | Semiconductor device |
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