JPS57144435A - Optical characteristic measuring device for optical system - Google Patents

Optical characteristic measuring device for optical system

Info

Publication number
JPS57144435A
JPS57144435A JP3022381A JP3022381A JPS57144435A JP S57144435 A JPS57144435 A JP S57144435A JP 3022381 A JP3022381 A JP 3022381A JP 3022381 A JP3022381 A JP 3022381A JP S57144435 A JPS57144435 A JP S57144435A
Authority
JP
Japan
Prior art keywords
lens
mask
luminous flux
examined
luminous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3022381A
Other languages
Japanese (ja)
Other versions
JPH0330099B2 (en
Inventor
Hiroshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP3022381A priority Critical patent/JPS57144435A/en
Priority to US06/353,505 priority patent/US4601575A/en
Priority to EP82101639A priority patent/EP0059480B1/en
Priority to DE8282101639T priority patent/DE3275320D1/en
Priority to DE198282101639T priority patent/DE59480T1/en
Publication of JPS57144435A publication Critical patent/JPS57144435A/en
Publication of JPH0330099B2 publication Critical patent/JPH0330099B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power
    • G01M11/0235—Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To measure the refractive characteristics of a lens to be examined by passing the luminous flux refracted by the lens to be examined through a mask having an obliquely intersecting aperture patterns and detecting the projected image thereof with a linear sensor. CONSTITUTION:The luminous flux radiated from a light source 2 which is driven by a driving circuit 1 is focused by a relay lens 3 at a pinhole 4. The luminous flux emitting from the pinhole 4 is paralleled by a collimator lens 5, and the paralleled luminous fluxes are reflected by a mirror 6 and are made incident to a luminous flux limiting mask 8. The mask 8 has two sets of slit groups consisting of at least two parallel straight line apertures, and having such a pattern wherein the inclination of the slit groups differs. After the parallel luminous fluxes are refracted according to the optical characteristics of a lens 7 to be examined, the necessary information component is selected by the mask 8, after which the luminous fluxes arrive at a detecting surface S. Here, line sensors 12, 13 are disposed on the plane conjugate with the surface S formed by the a relay lens 10 and a half mirror 11.
JP3022381A 1981-03-03 1981-03-03 Optical characteristic measuring device for optical system Granted JPS57144435A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP3022381A JPS57144435A (en) 1981-03-03 1981-03-03 Optical characteristic measuring device for optical system
US06/353,505 US4601575A (en) 1981-03-03 1982-03-01 Apparatus for measuring the characteristics of an optical system
EP82101639A EP0059480B1 (en) 1981-03-03 1982-03-03 An apparatus for measuring the characteristics of an optical system
DE8282101639T DE3275320D1 (en) 1981-03-03 1982-03-03 An apparatus for measuring the characteristics of an optical system
DE198282101639T DE59480T1 (en) 1981-03-03 1982-03-03 DEVICE FOR MEASURING THE CHARACTERISTICS OF AN OPTICAL SYSTEM.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3022381A JPS57144435A (en) 1981-03-03 1981-03-03 Optical characteristic measuring device for optical system

Publications (2)

Publication Number Publication Date
JPS57144435A true JPS57144435A (en) 1982-09-07
JPH0330099B2 JPH0330099B2 (en) 1991-04-26

Family

ID=12297714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3022381A Granted JPS57144435A (en) 1981-03-03 1981-03-03 Optical characteristic measuring device for optical system

Country Status (1)

Country Link
JP (1) JPS57144435A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50145249A (en) * 1974-05-08 1975-11-21

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50145249A (en) * 1974-05-08 1975-11-21

Also Published As

Publication number Publication date
JPH0330099B2 (en) 1991-04-26

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