JPS5729922A - Measuring device for refractive characteristic of optical system - Google Patents

Measuring device for refractive characteristic of optical system

Info

Publication number
JPS5729922A
JPS5729922A JP10551280A JP10551280A JPS5729922A JP S5729922 A JPS5729922 A JP S5729922A JP 10551280 A JP10551280 A JP 10551280A JP 10551280 A JP10551280 A JP 10551280A JP S5729922 A JPS5729922 A JP S5729922A
Authority
JP
Japan
Prior art keywords
linear
detected
mask
lens
port
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10551280A
Other languages
Japanese (ja)
Other versions
JPH0124251B2 (en
Inventor
Hiroshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP10551280A priority Critical patent/JPS5729922A/en
Publication of JPS5729922A publication Critical patent/JPS5729922A/en
Publication of JPH0124251B2 publication Critical patent/JPH0124251B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Eyeglasses (AREA)

Abstract

PURPOSE:To simplify the structure, by detecting at least 4 points of a circular part and at least 2 points of a linear part, in a projection pattern, and calculating the extent of deformation of a projection luminous flux in accordance with its detected data. CONSTITUTION:A light beam from a light source 1, which has been made to a collimated luminous flux is made incident to a lens 3 to be detected, which has been placed, shifting by a prescribed distance, and is refracted and polarized. Just behind the lens 3 to be detected is placed a mask 4 having a circular port 4a and a linear port 4b, and just before a linear sensor 5 is placed a mask 6 having two linear slits 6a, 6b. The linear sensor 5 detects each point of the luminous fluxes which has passed through the circular port 4a and the linear port 4b of the mask 4, at a position for conforming with the slits 6a, 6b in the course of its rotation, and provides 6 pieces of point information in all. A detection signal from the linear sensor 5 is provided to an operating circuit 9 through an amplifier 8, and a value indicating the refractive force of the lens 3 to be detected is displayed on a display device 10.
JP10551280A 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system Granted JPS5729922A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10551280A JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10551280A JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Publications (2)

Publication Number Publication Date
JPS5729922A true JPS5729922A (en) 1982-02-18
JPH0124251B2 JPH0124251B2 (en) 1989-05-10

Family

ID=14409646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10551280A Granted JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Country Status (1)

Country Link
JP (1) JPS5729922A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58130440A (en) * 1982-01-29 1983-08-03 Seiko Epson Corp Magnetic disc
JPS5927237A (en) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> Apparatus for inspecting optical system
JPS5928640A (en) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd Lens meter and target plate used therefor
JPS5928639A (en) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd Lens meter and target plate therefor
JPS6091241A (en) * 1983-10-26 1985-05-22 Matsushita Electric Ind Co Ltd Measuring device for refractive index of thin film
EP0264591A2 (en) * 1986-10-21 1988-04-27 Messerschmitt-Bölkow-Blohm Gesellschaft mit beschränkter Haftung Method for measuring the optical axes of a projector guide beam and device for carrying out the method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58130440A (en) * 1982-01-29 1983-08-03 Seiko Epson Corp Magnetic disc
JPS5927237A (en) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> Apparatus for inspecting optical system
JPH0365488B2 (en) * 1982-08-06 1991-10-14
JPS5928640A (en) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd Lens meter and target plate used therefor
JPS5928639A (en) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd Lens meter and target plate therefor
JPH0353571B2 (en) * 1982-08-10 1991-08-15 Topukon Kk
JPH0353572B2 (en) * 1982-08-10 1991-08-15 Topukon Kk
JPS6091241A (en) * 1983-10-26 1985-05-22 Matsushita Electric Ind Co Ltd Measuring device for refractive index of thin film
EP0264591A2 (en) * 1986-10-21 1988-04-27 Messerschmitt-Bölkow-Blohm Gesellschaft mit beschränkter Haftung Method for measuring the optical axes of a projector guide beam and device for carrying out the method

Also Published As

Publication number Publication date
JPH0124251B2 (en) 1989-05-10

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