JPS56168529A - Device for measuring refractive characteristic of optical system - Google Patents

Device for measuring refractive characteristic of optical system

Info

Publication number
JPS56168529A
JPS56168529A JP7239180A JP7239180A JPS56168529A JP S56168529 A JPS56168529 A JP S56168529A JP 7239180 A JP7239180 A JP 7239180A JP 7239180 A JP7239180 A JP 7239180A JP S56168529 A JPS56168529 A JP S56168529A
Authority
JP
Japan
Prior art keywords
lens
checked
mask
optical axis
points
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7239180A
Other languages
Japanese (ja)
Inventor
Hiroshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP7239180A priority Critical patent/JPS56168529A/en
Publication of JPS56168529A publication Critical patent/JPS56168529A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

PURPOSE:To obtain the refracting characteristics of a lens to be checked, by detecting at least five points in a projected patterns, and computing the deflection of the projected luminous fluxes or deformed quantity. CONSTITUTION:The light from a light source 1 is inputted to the lens to be checked 3 via a collimator lens 2. Said lens to be checked 3 is separated from the optical axis of the lens 2 by a specified distance. Immediately behind the lens to be checked 3, is arranged a mask 4 having a circular opening 4a. A linear sensor 5 is arranged within the shortest focus range in the direction of the optical axis. Immediately before the sensor 5, is arranged a mask 6 having three linear slits 6a-6c. The linear sensor 5 is rotated by a motor 7. At the positions, where the slits 6a-6c are coincided, two points in the luminous fluxes through the circular opening 4a of the mask 4 are detected. Altogether six point informations are given. The detected signal is given to an operating circuit 9 via an amplifier 8, and the value indicating the refracting power of the lens to be checked 3 is displayed on a display 10.
JP7239180A 1980-05-30 1980-05-30 Device for measuring refractive characteristic of optical system Pending JPS56168529A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7239180A JPS56168529A (en) 1980-05-30 1980-05-30 Device for measuring refractive characteristic of optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7239180A JPS56168529A (en) 1980-05-30 1980-05-30 Device for measuring refractive characteristic of optical system

Publications (1)

Publication Number Publication Date
JPS56168529A true JPS56168529A (en) 1981-12-24

Family

ID=13487926

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7239180A Pending JPS56168529A (en) 1980-05-30 1980-05-30 Device for measuring refractive characteristic of optical system

Country Status (1)

Country Link
JP (1) JPS56168529A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5927237A (en) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> Apparatus for inspecting optical system
US4609287A (en) * 1982-10-05 1986-09-02 Canon Kabushiki Kaisha Method of and apparatus for measuring refractive characteristics
US4611913A (en) * 1982-04-19 1986-09-16 Sugino Paul S Method and apparatus for analyzing ophthalmic elements and the like

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4611913A (en) * 1982-04-19 1986-09-16 Sugino Paul S Method and apparatus for analyzing ophthalmic elements and the like
JPS5927237A (en) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> Apparatus for inspecting optical system
JPH0365488B2 (en) * 1982-08-06 1991-10-14
US4609287A (en) * 1982-10-05 1986-09-02 Canon Kabushiki Kaisha Method of and apparatus for measuring refractive characteristics

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