JPS56168529A - Device for measuring refractive characteristic of optical system - Google Patents
Device for measuring refractive characteristic of optical systemInfo
- Publication number
- JPS56168529A JPS56168529A JP7239180A JP7239180A JPS56168529A JP S56168529 A JPS56168529 A JP S56168529A JP 7239180 A JP7239180 A JP 7239180A JP 7239180 A JP7239180 A JP 7239180A JP S56168529 A JPS56168529 A JP S56168529A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- checked
- mask
- optical axis
- points
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
PURPOSE:To obtain the refracting characteristics of a lens to be checked, by detecting at least five points in a projected patterns, and computing the deflection of the projected luminous fluxes or deformed quantity. CONSTITUTION:The light from a light source 1 is inputted to the lens to be checked 3 via a collimator lens 2. Said lens to be checked 3 is separated from the optical axis of the lens 2 by a specified distance. Immediately behind the lens to be checked 3, is arranged a mask 4 having a circular opening 4a. A linear sensor 5 is arranged within the shortest focus range in the direction of the optical axis. Immediately before the sensor 5, is arranged a mask 6 having three linear slits 6a-6c. The linear sensor 5 is rotated by a motor 7. At the positions, where the slits 6a-6c are coincided, two points in the luminous fluxes through the circular opening 4a of the mask 4 are detected. Altogether six point informations are given. The detected signal is given to an operating circuit 9 via an amplifier 8, and the value indicating the refracting power of the lens to be checked 3 is displayed on a display 10.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7239180A JPS56168529A (en) | 1980-05-30 | 1980-05-30 | Device for measuring refractive characteristic of optical system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7239180A JPS56168529A (en) | 1980-05-30 | 1980-05-30 | Device for measuring refractive characteristic of optical system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56168529A true JPS56168529A (en) | 1981-12-24 |
Family
ID=13487926
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7239180A Pending JPS56168529A (en) | 1980-05-30 | 1980-05-30 | Device for measuring refractive characteristic of optical system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56168529A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5927237A (en) * | 1982-08-06 | 1984-02-13 | Nippon Kogaku Kk <Nikon> | Apparatus for inspecting optical system |
US4609287A (en) * | 1982-10-05 | 1986-09-02 | Canon Kabushiki Kaisha | Method of and apparatus for measuring refractive characteristics |
US4611913A (en) * | 1982-04-19 | 1986-09-16 | Sugino Paul S | Method and apparatus for analyzing ophthalmic elements and the like |
-
1980
- 1980-05-30 JP JP7239180A patent/JPS56168529A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4611913A (en) * | 1982-04-19 | 1986-09-16 | Sugino Paul S | Method and apparatus for analyzing ophthalmic elements and the like |
JPS5927237A (en) * | 1982-08-06 | 1984-02-13 | Nippon Kogaku Kk <Nikon> | Apparatus for inspecting optical system |
JPH0365488B2 (en) * | 1982-08-06 | 1991-10-14 | ||
US4609287A (en) * | 1982-10-05 | 1986-09-02 | Canon Kabushiki Kaisha | Method of and apparatus for measuring refractive characteristics |
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