JPS57143253A - Analytical electron microscope - Google Patents

Analytical electron microscope

Info

Publication number
JPS57143253A
JPS57143253A JP56028107A JP2810781A JPS57143253A JP S57143253 A JPS57143253 A JP S57143253A JP 56028107 A JP56028107 A JP 56028107A JP 2810781 A JP2810781 A JP 2810781A JP S57143253 A JPS57143253 A JP S57143253A
Authority
JP
Japan
Prior art keywords
detector
circuit
ray
sample
output signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56028107A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6322012B2 (enrdf_load_stackoverflow
Inventor
Yoshiyasu Harada
Takeshi Tomita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Jeol Ltd
Nihon Denshi KK
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK, Nippon Telegraph and Telephone Corp filed Critical Jeol Ltd
Priority to JP56028107A priority Critical patent/JPS57143253A/ja
Publication of JPS57143253A publication Critical patent/JPS57143253A/ja
Publication of JPS6322012B2 publication Critical patent/JPS6322012B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
JP56028107A 1981-02-27 1981-02-27 Analytical electron microscope Granted JPS57143253A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56028107A JPS57143253A (en) 1981-02-27 1981-02-27 Analytical electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56028107A JPS57143253A (en) 1981-02-27 1981-02-27 Analytical electron microscope

Publications (2)

Publication Number Publication Date
JPS57143253A true JPS57143253A (en) 1982-09-04
JPS6322012B2 JPS6322012B2 (enrdf_load_stackoverflow) 1988-05-10

Family

ID=12239580

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56028107A Granted JPS57143253A (en) 1981-02-27 1981-02-27 Analytical electron microscope

Country Status (1)

Country Link
JP (1) JPS57143253A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS6322012B2 (enrdf_load_stackoverflow) 1988-05-10

Similar Documents

Publication Publication Date Title
JPS5457949A (en) Automatic focusing unit for scanning electron microscope and so on
JPS55156867A (en) Potential measuring device
FR2380556A1 (fr) Procede et appareillage de controle de circuits electroniques par faisceau d'electrons
JPS5780649A (en) Electron ray energy analyzer
JPS57143253A (en) Analytical electron microscope
JPS57197454A (en) X-ray analysing apparatus
JPS54114173A (en) Electronic probe device
JPS52117690A (en) Zeeman atomic absorption analysis and apparatus therefor
JPS5418269A (en) Electron beam detector
JPS57210549A (en) Method of correction attendant on deflection
JPS537190A (en) Scanning type x-ray apparatus
JPS54138467A (en) Scanning type electron microscope or resembling apparatus
JPS54105973A (en) Axis matching device for electron beam device
JPS54109897A (en) Specimen analytical apparatus in scanning electron microscope or the like
JPS53129587A (en) Electron beam exposure unit
JPS5557248A (en) Scanned electron image observing apparatus
JPS53125695A (en) Exposing method for electron rays
JPS6429788A (en) Radiation detector
JPS57168460A (en) Scanning electron microscope
JPS5336291A (en) Mass spectrometer
JPS5210667A (en) Transmission type electronic microscope processing x-ray analysis func tion
JPS53122477A (en) End control system of auto balance circuit in eddy current flaw detector
JPS5750290A (en) Copying control method for groove on rear side of electron beam welding
Schneider Investigations of Irradiated Austenitic Stainless Steels by STEM and EDA
JPS55144577A (en) Energy analyzer for electron ray