JPS57139602A - Detection of non-metal layer on metal surface and equipment for the same - Google Patents

Detection of non-metal layer on metal surface and equipment for the same

Info

Publication number
JPS57139602A
JPS57139602A JP2511881A JP2511881A JPS57139602A JP S57139602 A JPS57139602 A JP S57139602A JP 2511881 A JP2511881 A JP 2511881A JP 2511881 A JP2511881 A JP 2511881A JP S57139602 A JPS57139602 A JP S57139602A
Authority
JP
Japan
Prior art keywords
detector
capacitance
metal layer
thickness
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2511881A
Other languages
Japanese (ja)
Inventor
Yukio Nakamori
Youichi Fujikake
Toshimi Washitani
Shinichi Kamimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP2511881A priority Critical patent/JPS57139602A/en
Publication of JPS57139602A publication Critical patent/JPS57139602A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Continuous Casting (AREA)

Abstract

PURPOSE:To measure the thickness of non-metal layer on metal surface directly and accurately by providing an eddy current detector and a capacitance detector directly under a mold. CONSTITUTION:An eddy current detector 6 and a capacitance detector 8 are provided directly under a mold 2. A constant oscillated power of, for instance, 500kHz is supplied to the detection terminal of the eddy current detector 6 by a displacement converter 7 and a voltage change corresponding to the distance of a cast piece 3. On the other hand, a constant oscillated power of, for instance, 10kHz is supplied to the capacitance detector 8 by a displacement converter 9 and the capacitance between the cast piece 3 which contains slag film 50 and the detector 8 is detected by the displacement converter 9. The respective output signals of the converters 7 and 9 are compared and calculated by a signal processor 10 and the thickness of the slag film 50 is indicated by a recorder 13. The control signal is indicated 12 by the output of the converter 7 and the and the signal processor 10 via a calculater 11. With this constitution the thickness of the non-metal layer on the metal surface can be measured directly and accurately.
JP2511881A 1981-02-23 1981-02-23 Detection of non-metal layer on metal surface and equipment for the same Pending JPS57139602A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2511881A JPS57139602A (en) 1981-02-23 1981-02-23 Detection of non-metal layer on metal surface and equipment for the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2511881A JPS57139602A (en) 1981-02-23 1981-02-23 Detection of non-metal layer on metal surface and equipment for the same

Publications (1)

Publication Number Publication Date
JPS57139602A true JPS57139602A (en) 1982-08-28

Family

ID=12157008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2511881A Pending JPS57139602A (en) 1981-02-23 1981-02-23 Detection of non-metal layer on metal surface and equipment for the same

Country Status (1)

Country Link
JP (1) JPS57139602A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5525903A (en) * 1993-08-18 1996-06-11 Micro-Epsilon Messtechnik Gmbh & Co. Kg Eddy current method of acquiring the surface layer properties of a metallic target

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5525903A (en) * 1993-08-18 1996-06-11 Micro-Epsilon Messtechnik Gmbh & Co. Kg Eddy current method of acquiring the surface layer properties of a metallic target

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