JPS57133633A - Dry-etching device - Google Patents
Dry-etching deviceInfo
- Publication number
- JPS57133633A JPS57133633A JP1895381A JP1895381A JPS57133633A JP S57133633 A JPS57133633 A JP S57133633A JP 1895381 A JP1895381 A JP 1895381A JP 1895381 A JP1895381 A JP 1895381A JP S57133633 A JPS57133633 A JP S57133633A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- etching
- chamber
- subchamber
- dry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
- H01J37/185—Means for transferring objects between different enclosures of different pressure or atmosphere
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
Abstract
PURPOSE:To obtain the dry-etching device with which a microscopic work can be performed by a method wherein the subchamber, having a built-in adsorption type pump, is connected to the etching chamber constituting a dry-etching device through the intermediary of a valve, and unnecessary residue gas and reaction product gas are selectively exhausted from the chamber. CONSTITUTION:A pair of electrode cathode 2 and annode 3 are arranged opposing each other in the etching chamber 1 which constitutes the etching device, the substrate 4 to be etched is placed on the cathode 2, and etching gas is sent in through a flow meter 9. Also, a high frequency is applied to the cathode from a power source 12 while the flow-in speed of the gas is regulated by the trap 10 and an oil rotating pump 11 on the gas exhaust system, plasma 13 is generated between electrodes, and the etching is performed on the substrate 4. In this constitution, the adsorption type pump 16 and a subchamber 15, containing the thermoelectric couple 18 installed on the surface of the pump 16, are connected to the chamber 1 through the intermediary of a valve 14, the partial pressure of the residue gas is reduced by controlling the inside temperature of the chamber 15 using a cooling agent circulator 17, and the gas is adsorbed in the subchamber.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1895381A JPS57133633A (en) | 1981-02-13 | 1981-02-13 | Dry-etching device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1895381A JPS57133633A (en) | 1981-02-13 | 1981-02-13 | Dry-etching device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57133633A true JPS57133633A (en) | 1982-08-18 |
Family
ID=11986003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1895381A Pending JPS57133633A (en) | 1981-02-13 | 1981-02-13 | Dry-etching device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57133633A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60117629A (en) * | 1983-11-30 | 1985-06-25 | Hitachi Ltd | Vacuum processing device |
JPS61174634A (en) * | 1985-01-29 | 1986-08-06 | Toshiba Corp | Method of dry etching |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54146579A (en) * | 1978-05-09 | 1979-11-15 | Mitsubishi Electric Corp | Plasma etching device |
JPS5741368A (en) * | 1980-08-26 | 1982-03-08 | Toshiba Corp | Vacuum treatment chamber containing trap member |
-
1981
- 1981-02-13 JP JP1895381A patent/JPS57133633A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54146579A (en) * | 1978-05-09 | 1979-11-15 | Mitsubishi Electric Corp | Plasma etching device |
JPS5741368A (en) * | 1980-08-26 | 1982-03-08 | Toshiba Corp | Vacuum treatment chamber containing trap member |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60117629A (en) * | 1983-11-30 | 1985-06-25 | Hitachi Ltd | Vacuum processing device |
JPH0354458B2 (en) * | 1983-11-30 | 1991-08-20 | ||
JPS61174634A (en) * | 1985-01-29 | 1986-08-06 | Toshiba Corp | Method of dry etching |
JPH0526331B2 (en) * | 1985-01-29 | 1993-04-15 | Toshiba Kk |
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