JPS5713341A - Defect detector - Google Patents

Defect detector

Info

Publication number
JPS5713341A
JPS5713341A JP8751080A JP8751080A JPS5713341A JP S5713341 A JPS5713341 A JP S5713341A JP 8751080 A JP8751080 A JP 8751080A JP 8751080 A JP8751080 A JP 8751080A JP S5713341 A JPS5713341 A JP S5713341A
Authority
JP
Japan
Prior art keywords
inspected
memory
signal
stored
bottle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8751080A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6249927B2 (enrdf_load_stackoverflow
Inventor
Takashi Miyazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kirin Brewery Co Ltd
Original Assignee
Kirin Brewery Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kirin Brewery Co Ltd filed Critical Kirin Brewery Co Ltd
Priority to JP8751080A priority Critical patent/JPS5713341A/ja
Priority to US06/272,792 priority patent/US4448526A/en
Priority to NLAANVRAGE8102944,A priority patent/NL185368C/xx
Priority to AU71990/81A priority patent/AU535792B2/en
Priority to GB8119463A priority patent/GB2078948B/en
Priority to DE3124949A priority patent/DE3124949C2/de
Priority to CA000380646A priority patent/CA1175139A/en
Priority to DK285081A priority patent/DK156283C/da
Priority to FR8112630A priority patent/FR2485734B1/fr
Publication of JPS5713341A publication Critical patent/JPS5713341A/ja
Publication of JPS6249927B2 publication Critical patent/JPS6249927B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP8751080A 1980-06-27 1980-06-27 Defect detector Granted JPS5713341A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP8751080A JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector
US06/272,792 US4448526A (en) 1980-06-27 1981-06-11 Defect detecting method and device
NLAANVRAGE8102944,A NL185368C (nl) 1980-06-27 1981-06-18 Inrichting voor het detecteren van defecten in een voorwerp.
AU71990/81A AU535792B2 (en) 1980-06-27 1981-06-19 l
GB8119463A GB2078948B (en) 1980-06-27 1981-06-24 Defect detecting method and device
DE3124949A DE3124949C2 (de) 1980-06-27 1981-06-25 Fehlerdetektorvorrichtung zum Feststellen von Kratzern, Rissen, Sprüngen oder Einschlüssen in einem Gegenstand
CA000380646A CA1175139A (en) 1980-06-27 1981-06-26 Defect detecting method and device
DK285081A DK156283C (da) 1980-06-27 1981-06-26 Fejldetektionsapparat til konstatering af skrammer, revner, brud eller indeslutninger i en genstand
FR8112630A FR2485734B1 (fr) 1980-06-27 1981-06-26 Procede et appareil de detection de defauts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8751080A JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector

Publications (2)

Publication Number Publication Date
JPS5713341A true JPS5713341A (en) 1982-01-23
JPS6249927B2 JPS6249927B2 (enrdf_load_stackoverflow) 1987-10-22

Family

ID=13916974

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8751080A Granted JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector

Country Status (1)

Country Link
JP (1) JPS5713341A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937406A (ja) * 1982-05-06 1984-02-29 エムハート・グラス・マシーナリー・インベストメンツ・インコーポレーテッド きず検出器
EP0142379B1 (en) * 1983-11-17 1989-11-29 BRITISH TELECOMMUNICATIONS public limited company Jointing arrangements
JPH02276988A (ja) * 1989-04-18 1990-11-13 Kandenko Co Ltd 管内異物検知方法及びその装置
JPH06118026A (ja) * 1992-10-01 1994-04-28 Toyo Seikan Kaisha Ltd 容器内面検査方法

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2649500A (en) * 1949-12-16 1953-08-18 Owens Illinois Glass Co Inspecting apparatus
JPS5026935A (enrdf_load_stackoverflow) * 1973-06-16 1975-03-20
US3987244A (en) * 1975-12-31 1976-10-19 United Technologies Corporation Programmable image processor
JPS5316681A (en) * 1976-07-29 1978-02-15 Kirin Brewery Detector using laser rays
JPS53127583U (enrdf_load_stackoverflow) * 1977-03-17 1978-10-11
JPS5461980A (en) * 1977-10-27 1979-05-18 Nec Corp Automatic inspector of surface flaws
JPS5472094A (en) * 1977-11-21 1979-06-09 Sapporo Breweries Ltd Bottle bottom inspecting machine
JPS54110891A (en) * 1978-02-17 1979-08-30 Mitsubishi Electric Corp Pattern flaw inspecting apparatus

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2649500A (en) * 1949-12-16 1953-08-18 Owens Illinois Glass Co Inspecting apparatus
JPS5026935A (enrdf_load_stackoverflow) * 1973-06-16 1975-03-20
US3987244A (en) * 1975-12-31 1976-10-19 United Technologies Corporation Programmable image processor
JPS5316681A (en) * 1976-07-29 1978-02-15 Kirin Brewery Detector using laser rays
JPS53127583U (enrdf_load_stackoverflow) * 1977-03-17 1978-10-11
JPS5461980A (en) * 1977-10-27 1979-05-18 Nec Corp Automatic inspector of surface flaws
JPS5472094A (en) * 1977-11-21 1979-06-09 Sapporo Breweries Ltd Bottle bottom inspecting machine
JPS54110891A (en) * 1978-02-17 1979-08-30 Mitsubishi Electric Corp Pattern flaw inspecting apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937406A (ja) * 1982-05-06 1984-02-29 エムハート・グラス・マシーナリー・インベストメンツ・インコーポレーテッド きず検出器
EP0142379B1 (en) * 1983-11-17 1989-11-29 BRITISH TELECOMMUNICATIONS public limited company Jointing arrangements
JPH02276988A (ja) * 1989-04-18 1990-11-13 Kandenko Co Ltd 管内異物検知方法及びその装置
JPH06118026A (ja) * 1992-10-01 1994-04-28 Toyo Seikan Kaisha Ltd 容器内面検査方法

Also Published As

Publication number Publication date
JPS6249927B2 (enrdf_load_stackoverflow) 1987-10-22

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