JPS57125376A - Circuit for functioning/testing of ic for watch - Google Patents
Circuit for functioning/testing of ic for watchInfo
- Publication number
- JPS57125376A JPS57125376A JP56011078A JP1107881A JPS57125376A JP S57125376 A JPS57125376 A JP S57125376A JP 56011078 A JP56011078 A JP 56011078A JP 1107881 A JP1107881 A JP 1107881A JP S57125376 A JPS57125376 A JP S57125376A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- resetting
- outputs
- terminal
- watch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G04—HOROLOGY
- G04G—ELECTRONIC TIME-PIECES
- G04G5/00—Setting, i.e. correcting or changing, the time-indication
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Electric Clocks (AREA)
- Electromechanical Clocks (AREA)
Abstract
PURPOSE:To enable a terminal to set 3 conditions of a watch by a simple mechanism, by controlling opening and closing of a gate and resetting of a counter in accordance with 3-value signal including floating level. CONSTITUTION:When a reset/test terminal 100 is opened to set condition of floating, outputs TQ1 of an inverter 40 and a D type FF 41 and outputs Q2 of an exlusive OR gate 42 and a D type FF 43, etc., to which this outputs Q1 and Q1 passing through inverters 45 and 46 are added, are logically treated by a logical circuit 44, so that outputs ACC and RESET all become logically zero (0). Similarly, by variation of logical values of signals ACC and RESET put out from the circuit 44 in accordance with logic 1 or 0 of a signal added to the terminal 100, opening and resetting of clocked inverters 35 and 34, which form a gate, and resetting of a static frequency dividing circuit 36 are controlled. By doing so, 3 conditions of a step motor including the mormal operation, the resetting and the testing acceleration by frequency dividing output of high frequency are all done by a terminal, and therefore, a circuit for the both functioning and testing of IC for watch is obtained by a simple mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56011078A JPS57125376A (en) | 1981-01-28 | 1981-01-28 | Circuit for functioning/testing of ic for watch |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56011078A JPS57125376A (en) | 1981-01-28 | 1981-01-28 | Circuit for functioning/testing of ic for watch |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS57125376A true JPS57125376A (en) | 1982-08-04 |
Family
ID=11767940
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56011078A Pending JPS57125376A (en) | 1981-01-28 | 1981-01-28 | Circuit for functioning/testing of ic for watch |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57125376A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62116271A (en) * | 1985-11-15 | 1987-05-27 | Fujitsu Ltd | Test circuit |
| JP2010071729A (en) * | 2008-09-17 | 2010-04-02 | Mitsumi Electric Co Ltd | Semiconductor integrated circuit for driving motor and method for testing |
| JP2011013120A (en) * | 2009-07-02 | 2011-01-20 | Seiko Instruments Inc | Integrated circuit for electronic clock, and electronic clock |
-
1981
- 1981-01-28 JP JP56011078A patent/JPS57125376A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62116271A (en) * | 1985-11-15 | 1987-05-27 | Fujitsu Ltd | Test circuit |
| JPH0644031B2 (en) * | 1985-11-15 | 1994-06-08 | 富士通株式会社 | Test circuit |
| JP2010071729A (en) * | 2008-09-17 | 2010-04-02 | Mitsumi Electric Co Ltd | Semiconductor integrated circuit for driving motor and method for testing |
| JP2011013120A (en) * | 2009-07-02 | 2011-01-20 | Seiko Instruments Inc | Integrated circuit for electronic clock, and electronic clock |
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