JPS57117277A - Manufacture of mos semiconductor device - Google Patents

Manufacture of mos semiconductor device

Info

Publication number
JPS57117277A
JPS57117277A JP366881A JP366881A JPS57117277A JP S57117277 A JPS57117277 A JP S57117277A JP 366881 A JP366881 A JP 366881A JP 366881 A JP366881 A JP 366881A JP S57117277 A JPS57117277 A JP S57117277A
Authority
JP
Japan
Prior art keywords
source
drain
regions
gate
oxide film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP366881A
Other languages
Japanese (ja)
Inventor
Takeshi Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP366881A priority Critical patent/JPS57117277A/en
Publication of JPS57117277A publication Critical patent/JPS57117277A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)

Abstract

PURPOSE:To eliminate discrepancy of positioning of a gate PR in manufacture of an MOS semiconductor device by a method wherein after thermal oxide films are formed on the main surfaces of the regions other than the regions to form a source and a drain, the source and the drain are formed by ion implantation. CONSTITUTION:An oxide film is formed on the main surface of a semiconductor substrate, and moreover nitride films 13a, 13b are made to grow. Then the main surface of the semiconductor substrate 11 at the regions other than the regions 31, 41 to form the source and the drain are made to be exposed by the lithography technique, and the thermal oxide films 21-23 are formed by high temperature oxidation. The source 31 and the drain 41 are formed by ion implantation and the high temperature treatment. The oxide film at the region to form a gate is removed, and after the nitride films 13a, 13b on the source and drain regions 31, 41 are removed, a new gate oxide film 51 is formed. Contact holes 61, 62 of the source and the drain regions 31, 41 are formed, and a metal is evaporated to form the source, drain and gate electrodes 71-73.
JP366881A 1981-01-12 1981-01-12 Manufacture of mos semiconductor device Pending JPS57117277A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP366881A JPS57117277A (en) 1981-01-12 1981-01-12 Manufacture of mos semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP366881A JPS57117277A (en) 1981-01-12 1981-01-12 Manufacture of mos semiconductor device

Publications (1)

Publication Number Publication Date
JPS57117277A true JPS57117277A (en) 1982-07-21

Family

ID=11563807

Family Applications (1)

Application Number Title Priority Date Filing Date
JP366881A Pending JPS57117277A (en) 1981-01-12 1981-01-12 Manufacture of mos semiconductor device

Country Status (1)

Country Link
JP (1) JPS57117277A (en)

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