JPS57111471A - Test-pattern generator - Google Patents

Test-pattern generator

Info

Publication number
JPS57111471A
JPS57111471A JP55186694A JP18669480A JPS57111471A JP S57111471 A JPS57111471 A JP S57111471A JP 55186694 A JP55186694 A JP 55186694A JP 18669480 A JP18669480 A JP 18669480A JP S57111471 A JPS57111471 A JP S57111471A
Authority
JP
Japan
Prior art keywords
counter
pattern
frequency
accessed
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55186694A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6319027B2 (enrdf_load_stackoverflow
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP55186694A priority Critical patent/JPS57111471A/ja
Publication of JPS57111471A publication Critical patent/JPS57111471A/ja
Publication of JPS6319027B2 publication Critical patent/JPS6319027B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55186694A 1980-12-29 1980-12-29 Test-pattern generator Granted JPS57111471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55186694A JPS57111471A (en) 1980-12-29 1980-12-29 Test-pattern generator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55186694A JPS57111471A (en) 1980-12-29 1980-12-29 Test-pattern generator

Publications (2)

Publication Number Publication Date
JPS57111471A true JPS57111471A (en) 1982-07-10
JPS6319027B2 JPS6319027B2 (enrdf_load_stackoverflow) 1988-04-21

Family

ID=16192992

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55186694A Granted JPS57111471A (en) 1980-12-29 1980-12-29 Test-pattern generator

Country Status (1)

Country Link
JP (1) JPS57111471A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57150200A (en) * 1981-03-11 1982-09-16 Mitsubishi Electric Corp Ultra-high speed test pattern generator
JPS62500320A (ja) * 1984-10-01 1987-02-05 モトロ−ラ・インコ−ポレ−テッド 自動化集積回路テスタ
US5018145A (en) * 1988-09-06 1991-05-21 Hitachi, Ltd. IC tester

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5361234A (en) * 1976-11-12 1978-06-01 Matsushita Electric Ind Co Ltd Memory unit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5361234A (en) * 1976-11-12 1978-06-01 Matsushita Electric Ind Co Ltd Memory unit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57150200A (en) * 1981-03-11 1982-09-16 Mitsubishi Electric Corp Ultra-high speed test pattern generator
JPS62500320A (ja) * 1984-10-01 1987-02-05 モトロ−ラ・インコ−ポレ−テッド 自動化集積回路テスタ
US5018145A (en) * 1988-09-06 1991-05-21 Hitachi, Ltd. IC tester

Also Published As

Publication number Publication date
JPS6319027B2 (enrdf_load_stackoverflow) 1988-04-21

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