JPS57106870A - Vector voltage ratio measuring device - Google Patents

Vector voltage ratio measuring device

Info

Publication number
JPS57106870A
JPS57106870A JP18269380A JP18269380A JPS57106870A JP S57106870 A JPS57106870 A JP S57106870A JP 18269380 A JP18269380 A JP 18269380A JP 18269380 A JP18269380 A JP 18269380A JP S57106870 A JPS57106870 A JP S57106870A
Authority
JP
Japan
Prior art keywords
voltage ratio
vector voltage
sample
measuring device
arithmetic processor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18269380A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0235949B2 (enrdf_load_stackoverflow
Inventor
Nobuhide Nishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP18269380A priority Critical patent/JPS57106870A/ja
Publication of JPS57106870A publication Critical patent/JPS57106870A/ja
Publication of JPH0235949B2 publication Critical patent/JPH0235949B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP18269380A 1980-12-23 1980-12-23 Vector voltage ratio measuring device Granted JPS57106870A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18269380A JPS57106870A (en) 1980-12-23 1980-12-23 Vector voltage ratio measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18269380A JPS57106870A (en) 1980-12-23 1980-12-23 Vector voltage ratio measuring device

Publications (2)

Publication Number Publication Date
JPS57106870A true JPS57106870A (en) 1982-07-02
JPH0235949B2 JPH0235949B2 (enrdf_load_stackoverflow) 1990-08-14

Family

ID=16122776

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18269380A Granted JPS57106870A (en) 1980-12-23 1980-12-23 Vector voltage ratio measuring device

Country Status (1)

Country Link
JP (1) JPS57106870A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7466253B2 (en) 2006-08-03 2008-12-16 Kabushiki Kaisha Toshiba Integrated circuit, self-test method for the integrated circuit, and optical disc apparatus including the integrated circuit

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008177991A (ja) * 2007-01-22 2008-07-31 Sansha Electric Mfg Co Ltd 位相差検出回路、ｐｌｌ回路、位相差検出方法及び位相差検出プログラム

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5330375A (en) * 1976-09-02 1978-03-22 Genrad Inc Method of automatically measuring impedance or other parameters due to microprocessor calculation technique
JPS5465070A (en) * 1977-11-01 1979-05-25 Teac Corp Digital level indicator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5330375A (en) * 1976-09-02 1978-03-22 Genrad Inc Method of automatically measuring impedance or other parameters due to microprocessor calculation technique
JPS5465070A (en) * 1977-11-01 1979-05-25 Teac Corp Digital level indicator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7466253B2 (en) 2006-08-03 2008-12-16 Kabushiki Kaisha Toshiba Integrated circuit, self-test method for the integrated circuit, and optical disc apparatus including the integrated circuit

Also Published As

Publication number Publication date
JPH0235949B2 (enrdf_load_stackoverflow) 1990-08-14

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