JPS569957A - Combined unit of ion gun, electron gun and analyzer in auger electron spectroscope - Google Patents
Combined unit of ion gun, electron gun and analyzer in auger electron spectroscopeInfo
- Publication number
- JPS569957A JPS569957A JP8443879A JP8443879A JPS569957A JP S569957 A JPS569957 A JP S569957A JP 8443879 A JP8443879 A JP 8443879A JP 8443879 A JP8443879 A JP 8443879A JP S569957 A JPS569957 A JP S569957A
- Authority
- JP
- Japan
- Prior art keywords
- electron
- gun
- analyzer
- ion
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To permit the deepest part of a crater of ion etching to easily agree with its analyzed point, by arranging a position accuracy for the virtual point of analysis, targeted from an ion gun, electron gun and analyzer, to be determined all by a mechanical accuracy. CONSTITUTION:A combined unit comprises an ion gun 1, for irradiating an ion to a sample 6 to made it processed etching, an electron gun 2, that irradiates an electron to the sample 6 and allows an auger electron to be emitted from the sample 6, and an energy analyzer 3 of cylindrical mirror type which performs a work of elementary analysis by detecting the anger electron emitted from the sample 6. A positioning work is previously performed for a virtual point of analysis, and the ion gun 1 and the electron gun 2 are fixed to the outer face of the analyzer 3. Then to an analyzer mounting plate 4, to which the analyzer 3 is mounted, having a vacuum flange 4a fitted to a flange 8a of a port 8 of a vacuum vessel 5, electrical connection wires 1a and 2a of the ion gun 1 and the electron gun 2 to the atmospheric side are equipped in such a manner that a vacuum sealing in the vacuum vessel 5 can be maintained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54084438A JPS5857861B2 (en) | 1979-07-05 | 1979-07-05 | Combination of ion gun, electron gun and analyzer in Auger electron spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54084438A JPS5857861B2 (en) | 1979-07-05 | 1979-07-05 | Combination of ion gun, electron gun and analyzer in Auger electron spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS569957A true JPS569957A (en) | 1981-01-31 |
JPS5857861B2 JPS5857861B2 (en) | 1983-12-22 |
Family
ID=13830588
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54084438A Expired JPS5857861B2 (en) | 1979-07-05 | 1979-07-05 | Combination of ion gun, electron gun and analyzer in Auger electron spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5857861B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6396680A (en) * | 1986-10-13 | 1988-04-27 | Seikosha Co Ltd | Developing device for electrophotographic recorder |
-
1979
- 1979-07-05 JP JP54084438A patent/JPS5857861B2/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS5857861B2 (en) | 1983-12-22 |
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