JPS57161643A - Measuring device for work function - Google Patents

Measuring device for work function

Info

Publication number
JPS57161643A
JPS57161643A JP4899581A JP4899581A JPS57161643A JP S57161643 A JPS57161643 A JP S57161643A JP 4899581 A JP4899581 A JP 4899581A JP 4899581 A JP4899581 A JP 4899581A JP S57161643 A JPS57161643 A JP S57161643A
Authority
JP
Japan
Prior art keywords
work function
anode
measuring device
hemisphere
cathode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4899581A
Other languages
Japanese (ja)
Inventor
Mamoru Tateno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP4899581A priority Critical patent/JPS57161643A/en
Publication of JPS57161643A publication Critical patent/JPS57161643A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/002—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the work function voltage
    • G01N27/005—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the work function voltage by determining the work function in vacuum

Abstract

PURPOSE:To effectively collect emitted photoelectrons corresponding to the job and thereby improve the precision of measurement by a method wherein the anode of a work function measuring device for which the emission of the photoelectrons by the application of light is utilized is formed in the shape of a hemisphere and a cathode is arranged oppositely almost at the center of the hemisphere. CONSTITUTION:An anode 7 inside a hermetically-sealed container 1 which forms a work function measuring device has the shape of a hemisphere of about 180 deg., and nearly at the center thereof, a cathode 9 of a metal material to be measured which is fixed by a sample holder 10 is set. Accordingly, photoelectrons delivered from the cathode 9 corresponding to the work by an irradiation light sent through a transparent window 3, a reflection board 5 and the inlet hole 8 of the anode 8 are collected effectively by the anode 7 and thus the precision of the measurement of the work function can be improved.
JP4899581A 1981-03-31 1981-03-31 Measuring device for work function Pending JPS57161643A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4899581A JPS57161643A (en) 1981-03-31 1981-03-31 Measuring device for work function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4899581A JPS57161643A (en) 1981-03-31 1981-03-31 Measuring device for work function

Publications (1)

Publication Number Publication Date
JPS57161643A true JPS57161643A (en) 1982-10-05

Family

ID=12818785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4899581A Pending JPS57161643A (en) 1981-03-31 1981-03-31 Measuring device for work function

Country Status (1)

Country Link
JP (1) JPS57161643A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60262042A (en) * 1984-06-09 1985-12-25 Rikagaku Kenkyusho Measurement of photoelectric work function
JPH01138450A (en) * 1987-11-24 1989-05-31 Riken Keiki Kk Photoelectron emission threshold value measuring instrument
WO2021130760A1 (en) * 2019-12-28 2021-07-01 Institute For Plasma Research Vacuum compatible device for measurement of work function and alkali metal atom flux

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518915A (en) * 1978-07-27 1980-02-09 Yoshitoshi Nanba Read auger analyzer
JPS5523454A (en) * 1978-08-09 1980-02-19 Yoshitoshi Nanba Lead auger analyzer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5518915A (en) * 1978-07-27 1980-02-09 Yoshitoshi Nanba Read auger analyzer
JPS5523454A (en) * 1978-08-09 1980-02-19 Yoshitoshi Nanba Lead auger analyzer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60262042A (en) * 1984-06-09 1985-12-25 Rikagaku Kenkyusho Measurement of photoelectric work function
JPH0556459B2 (en) * 1984-06-09 1993-08-19 Rikagaku Kenkyusho
JPH01138450A (en) * 1987-11-24 1989-05-31 Riken Keiki Kk Photoelectron emission threshold value measuring instrument
WO2021130760A1 (en) * 2019-12-28 2021-07-01 Institute For Plasma Research Vacuum compatible device for measurement of work function and alkali metal atom flux

Similar Documents

Publication Publication Date Title
JPS53135660A (en) Fluorescent photometric microscope using laser light
JPS5795056A (en) Appearance inspecting process
JPS57161643A (en) Measuring device for work function
JPS6491037A (en) Cell for fluorometric analysis
DE68927101T2 (en) DEVICE FOR CARRYING OUT MULTIPLE SIMULTANEOUS MEASUREMENTS OF ELECTROCHEMILUMINESCENT PHENOMENON
JPS576310A (en) Method and apparatus for measuring film thickness
JPS54685A (en) Simultaneously measurement of florescent x ray and diffracted x ray of minute area
Smith Spectrographic analysis of rare and high purity materials
JPS5418269A (en) Electron beam detector
JPS5737252A (en) Emission spectroscopic analysis for inclusion detection of steel
JPS53118190A (en) Concentration distribution analyzing method in depth direction
JPS55131752A (en) Method of luminescence spectroscopic analysis for minute quantity of element contained in metal
JPS5468287A (en) Fluorescence measuring apparatus of flowing specimen
JPS543593A (en) Solid surface analyzer
JPS54142968A (en) Manufacture of cathode-ray tube
JPS54144864A (en) Measuring method of electrode distance for electron gun
JPS57207854A (en) Method and apparatus for measuring chemical condition
JPS5772073A (en) Voltage measuring device
JPS57149938A (en) Inspection method for liquid leakage of battery
Tixier et al. Principles, limits and statistical evaluation of quantitative X-ray analysis
JPS52153492A (en) Quantitative determination of inclusions in metals
JPS52127390A (en) Energy analyzer for secondary electron
JPS52101095A (en) Glow discharge tube for spectrochemical analysis
JPS569957A (en) Combined unit of ion gun, electron gun and analyzer in auger electron spectroscope
JPS543594A (en) Solid surface element analyzer