JPS5680131A - Method and device for ion beam etching - Google Patents
Method and device for ion beam etchingInfo
- Publication number
- JPS5680131A JPS5680131A JP15769579A JP15769579A JPS5680131A JP S5680131 A JPS5680131 A JP S5680131A JP 15769579 A JP15769579 A JP 15769579A JP 15769579 A JP15769579 A JP 15769579A JP S5680131 A JPS5680131 A JP S5680131A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- organic layer
- oxygen ion
- pattern
- converged
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching
- H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating or etching for evaporating or etching
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15769579A JPS5680131A (en) | 1979-12-05 | 1979-12-05 | Method and device for ion beam etching |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15769579A JPS5680131A (en) | 1979-12-05 | 1979-12-05 | Method and device for ion beam etching |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5680131A true JPS5680131A (en) | 1981-07-01 |
Family
ID=15655356
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15769579A Pending JPS5680131A (en) | 1979-12-05 | 1979-12-05 | Method and device for ion beam etching |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5680131A (ja) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5718324A (en) * | 1980-07-07 | 1982-01-30 | Mitsubishi Electric Corp | Method of working |
JPS59168652A (ja) * | 1983-03-16 | 1984-09-22 | Hitachi Ltd | 素子修正方法及びその装置 |
JPS60136315A (ja) * | 1983-12-26 | 1985-07-19 | Hitachi Ltd | マイクロイオンビ−ム加工方法およびその装置 |
JPS61174630A (ja) * | 1985-01-29 | 1986-08-06 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
JPS63170940A (ja) * | 1987-12-02 | 1988-07-14 | Hitachi Ltd | Ic素子の修正方法 |
JPS63296241A (ja) * | 1987-12-02 | 1988-12-02 | Hitachi Ltd | Ic素子の加工装置 |
JPH06283534A (ja) * | 1993-03-26 | 1994-10-07 | Hitachi Ltd | Ic素子における配線接続装置 |
JPH06295910A (ja) * | 1993-03-26 | 1994-10-21 | Hitachi Ltd | Ic素子およびic素子における配線接続方法 |
JPH06302603A (ja) * | 1993-03-26 | 1994-10-28 | Hitachi Ltd | Ic素子 |
-
1979
- 1979-12-05 JP JP15769579A patent/JPS5680131A/ja active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5718324A (en) * | 1980-07-07 | 1982-01-30 | Mitsubishi Electric Corp | Method of working |
JPS59168652A (ja) * | 1983-03-16 | 1984-09-22 | Hitachi Ltd | 素子修正方法及びその装置 |
JPH0514416B2 (ja) * | 1983-03-16 | 1993-02-25 | Hitachi Ltd | |
JPS60136315A (ja) * | 1983-12-26 | 1985-07-19 | Hitachi Ltd | マイクロイオンビ−ム加工方法およびその装置 |
JPH0510822B2 (ja) * | 1983-12-26 | 1993-02-10 | Hitachi Ltd | |
JPS61174630A (ja) * | 1985-01-29 | 1986-08-06 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
JPS63170940A (ja) * | 1987-12-02 | 1988-07-14 | Hitachi Ltd | Ic素子の修正方法 |
JPS63296241A (ja) * | 1987-12-02 | 1988-12-02 | Hitachi Ltd | Ic素子の加工装置 |
JPH06283534A (ja) * | 1993-03-26 | 1994-10-07 | Hitachi Ltd | Ic素子における配線接続装置 |
JPH06295910A (ja) * | 1993-03-26 | 1994-10-21 | Hitachi Ltd | Ic素子およびic素子における配線接続方法 |
JPH06302603A (ja) * | 1993-03-26 | 1994-10-28 | Hitachi Ltd | Ic素子 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW343347B (en) | Charged-particle-beam exposure device and charged-particle-beam exposure method | |
EP0398335A3 (en) | Converged ion beam apparatus | |
JPS5680131A (en) | Method and device for ion beam etching | |
EP0035556B1 (en) | Electron beam system | |
JPS5776837A (en) | Apparatus for multipile electron beam exposure | |
JPS57210549A (en) | Method of correction attendant on deflection | |
JP3155570B2 (ja) | 収束イオンビーム質量分析方法及び収束イオンビーム質量分析複合装置 | |
JPH01169860A (ja) | 荷電粒子線装置 | |
JPH08104980A (ja) | クラスターイオンビームスパッター装置 | |
KR101116178B1 (ko) | 이온빔을 이용한 박판 성형가공용 그리드 형성방법 | |
JPS6415604A (en) | Measuring apparatus for length by electron beam | |
JPS61114453A (ja) | 荷電粒子線装置 | |
JPS5457862A (en) | Ion-beam irradiation device | |
SU1211825A1 (ru) | Способ корпускул рного облучени подложки и устройство дл его осуществлени | |
JPS56106358A (en) | Scan type electron microscope | |
JPS63225459A (ja) | レ−ザイオン源装置 | |
JPS5656637A (en) | Forming method of fine pattern | |
JPS6324061A (ja) | イオン注入装置 | |
JPS5326193A (en) | Observing method of ion beam radiati on point positions | |
JPS5740929A (en) | Processing method of resist | |
JPS55134174A (en) | Sputtering treatment with ion beam | |
JPS56125836A (en) | Method for electron beam exposure | |
JPS56133829A (en) | Control for beam width | |
JPS6314867A (ja) | イオン注入装置 | |
JPS62223756A (ja) | イオンビ−ム加工装置 |