JPS5679925A - High-resolution infrared radiation measuring method - Google Patents

High-resolution infrared radiation measuring method

Info

Publication number
JPS5679925A
JPS5679925A JP15768479A JP15768479A JPS5679925A JP S5679925 A JPS5679925 A JP S5679925A JP 15768479 A JP15768479 A JP 15768479A JP 15768479 A JP15768479 A JP 15768479A JP S5679925 A JPS5679925 A JP S5679925A
Authority
JP
Japan
Prior art keywords
infrared
display
ray
polynomial
infrared radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15768479A
Other languages
Japanese (ja)
Other versions
JPS6243487B2 (en
Inventor
Kazuhiko Honjo
Yoichiro Takayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15768479A priority Critical patent/JPS5679925A/en
Publication of JPS5679925A publication Critical patent/JPS5679925A/en
Publication of JPS6243487B2 publication Critical patent/JPS6243487B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/025Interfacing a pyrometer to an external device or network; User interface
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/241Devices for focusing
    • G02B21/244Devices for focusing using image analysis techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

PURPOSE:To improve resolution by performing the arithmetic processing of the intensity of infrared radiation obtained from the 1st and 2nd specific parts of a sample to be measured. CONSTITUTION:Infrared rays focused through movable infrared-ray focusing device 21 are inputted to infrared-ray microscope 22 equipped with an infrared-ray detector and converted thefe into an electric signal, whose value is displayed on display part 23. In such a measurement system, movable infrared-ray focusing device 21 is moved and respective positions and display values on display part 23 at respective positions are recorded. The relation between series of measurement positions and display values is expressed as a polynomial of measurement positions to display value in the method of the least squares. The intensity of the radiation per unit area is found by an electronic computer by use of this polynomial.
JP15768479A 1979-12-05 1979-12-05 High-resolution infrared radiation measuring method Granted JPS5679925A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15768479A JPS5679925A (en) 1979-12-05 1979-12-05 High-resolution infrared radiation measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15768479A JPS5679925A (en) 1979-12-05 1979-12-05 High-resolution infrared radiation measuring method

Publications (2)

Publication Number Publication Date
JPS5679925A true JPS5679925A (en) 1981-06-30
JPS6243487B2 JPS6243487B2 (en) 1987-09-14

Family

ID=15655118

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15768479A Granted JPS5679925A (en) 1979-12-05 1979-12-05 High-resolution infrared radiation measuring method

Country Status (1)

Country Link
JP (1) JPS5679925A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4242108B2 (en) * 2001-06-04 2009-03-18 パナソニック株式会社 Optical pickup head and information recording / reproducing apparatus

Also Published As

Publication number Publication date
JPS6243487B2 (en) 1987-09-14

Similar Documents

Publication Publication Date Title
ES480472A1 (en) Device for determining the spatial absorption distribution in a plane of examination
DE3279479D1 (en) Apparatus for measuring thickness
JPS5590843A (en) Method of measuring contaminated gas
JPS5794627A (en) Stress distribution measuring instrument
ATE49295T1 (en) OPTICAL-ELECTRONIC MEASUREMENT METHOD, A DEVICE REQUIRED FOR THIS AND THEIR USE.
JPS5417897A (en) Apparatus for measuring uranium or thorium in ore sample
JPS5679925A (en) High-resolution infrared radiation measuring method
JPS5759143A (en) Measuring method for grain size of granular material
DE3685325D1 (en) METHOD AND DEVICE FOR DETERMINING THE SPATIAL DISTRIBUTION OF A GAS.
JPS55159143A (en) Metal surface flaw detector
JPS5614126A (en) Radiation thermometer
ATE107413T1 (en) METHOD AND DEVICE FOR MEASURING THE TEMPERATURE OF A REMOTE OBJECT.
JPS5629116A (en) Measurement unit for moving distance
JPS5726721A (en) Surface temperature measuring device for object in furnace
JPH0333677A (en) Measuring apparatus for surface dose
JPS5614125A (en) Radiation thermometer
JPS55104706A (en) Method and apparatus for measurement of linearity
JPS56153222A (en) Thermography device
JPS53135374A (en) X-ray stress measuring device
JPS5742874A (en) Measuring device for radioactivity intensity
JPS56115932A (en) Measuring method for distribution of stress
COULSON et al. Investigation of atmospheric effects in image transfer(Dual channel polarizing radiometric measurements of atmospheric effects on image transfer)
JPS5287077A (en) Infrared ray detector
JPS54116280A (en) Measuring apparatus of red hot objects
JPS53124487A (en) Thermography apparatus