JPS5655041A - Positioning exposure - Google Patents

Positioning exposure

Info

Publication number
JPS5655041A
JPS5655041A JP12998579A JP12998579A JPS5655041A JP S5655041 A JPS5655041 A JP S5655041A JP 12998579 A JP12998579 A JP 12998579A JP 12998579 A JP12998579 A JP 12998579A JP S5655041 A JPS5655041 A JP S5655041A
Authority
JP
Japan
Prior art keywords
wafer
pattern
mask
elongated
represented
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12998579A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6214935B2 (enrdf_load_stackoverflow
Inventor
Sunao Ishihara
Eitaro Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP12998579A priority Critical patent/JPS5655041A/ja
Publication of JPS5655041A publication Critical patent/JPS5655041A/ja
Publication of JPS6214935B2 publication Critical patent/JPS6214935B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Control Of Position Or Direction (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP12998579A 1979-10-11 1979-10-11 Positioning exposure Granted JPS5655041A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12998579A JPS5655041A (en) 1979-10-11 1979-10-11 Positioning exposure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12998579A JPS5655041A (en) 1979-10-11 1979-10-11 Positioning exposure

Publications (2)

Publication Number Publication Date
JPS5655041A true JPS5655041A (en) 1981-05-15
JPS6214935B2 JPS6214935B2 (enrdf_load_stackoverflow) 1987-04-04

Family

ID=15023299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12998579A Granted JPS5655041A (en) 1979-10-11 1979-10-11 Positioning exposure

Country Status (1)

Country Link
JP (1) JPS5655041A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59134830A (ja) * 1982-12-30 1984-08-02 トムソン−セ−エスエフ 2つのクロ−ズアツプ平面上のパタ−ンの光学的配列方法およびその装置
JPH07209876A (ja) * 1995-01-30 1995-08-11 Canon Inc X線転写装置及び方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51140488A (en) * 1975-05-30 1976-12-03 Hitachi Ltd Mask alignment device
JPS524177A (en) * 1975-06-27 1977-01-13 Toshiba Corp Automatic mask aligning method
JPS5318970A (en) * 1976-08-05 1978-02-21 Siemens Ag Method of aligning relative position of substrate and photo mask
JPS5336998A (en) * 1976-09-15 1978-04-05 Fuaburitsuku Nat Erusutaru Sa Sport gun

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51140488A (en) * 1975-05-30 1976-12-03 Hitachi Ltd Mask alignment device
JPS524177A (en) * 1975-06-27 1977-01-13 Toshiba Corp Automatic mask aligning method
JPS5318970A (en) * 1976-08-05 1978-02-21 Siemens Ag Method of aligning relative position of substrate and photo mask
JPS5336998A (en) * 1976-09-15 1978-04-05 Fuaburitsuku Nat Erusutaru Sa Sport gun

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59134830A (ja) * 1982-12-30 1984-08-02 トムソン−セ−エスエフ 2つのクロ−ズアツプ平面上のパタ−ンの光学的配列方法およびその装置
JPH07209876A (ja) * 1995-01-30 1995-08-11 Canon Inc X線転写装置及び方法

Also Published As

Publication number Publication date
JPS6214935B2 (enrdf_load_stackoverflow) 1987-04-04

Similar Documents

Publication Publication Date Title
JPS52109875A (en) Position matching system for mask and wafer and its unit
DE2861539D1 (en) Process for the fabrication of masks for lithographic processes using a photoresist
JPS6489430A (en) Position aligning method
JPS5332759A (en) Precision coordinate position detection and position control unit by composite diffration grating method
GB1520586A (en) Method of exposing stripe like areas to light
JPS5655041A (en) Positioning exposure
JPS5211774A (en) Method of detecting relative position of patterns
JPS6468926A (en) Measurement of image distortion in projection optical system
JPS56128946A (en) Photomask correcting method
JPS55128832A (en) Method of making minute pattern
JPS56165325A (en) Formation of pattern
JPS5251874A (en) Electron beam exposure device
JPS5280041A (en) Method for selectively exposing photosensitive material
JPS533069A (en) Photoetching mask
JPS54141573A (en) Mask for exposure
JPS649617A (en) Exposure method
JPS5398783A (en) X-ray copying mask
JPS51114931A (en) Photoresist pattern formation method
JPS5621328A (en) Method of making pattern
JPS5388728A (en) Method of forming pattern
JPS5568626A (en) Pattern formation
JPS53117463A (en) Position detection method
JPS568822A (en) Manufacture of semiconductor device
JPS5437685A (en) Electron beam exposure unit
JPS5517933A (en) Crt face marking