JPS5653431A - Method and device for measuring stress with x-ray - Google Patents

Method and device for measuring stress with x-ray

Info

Publication number
JPS5653431A
JPS5653431A JP12863279A JP12863279A JPS5653431A JP S5653431 A JPS5653431 A JP S5653431A JP 12863279 A JP12863279 A JP 12863279A JP 12863279 A JP12863279 A JP 12863279A JP S5653431 A JPS5653431 A JP S5653431A
Authority
JP
Japan
Prior art keywords
stress
measured
ray
ray measurement
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12863279A
Other languages
Japanese (ja)
Inventor
Atsushi Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Sharyo Ltd
Original Assignee
Nippon Sharyo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Sharyo Ltd filed Critical Nippon Sharyo Ltd
Priority to JP12863279A priority Critical patent/JPS5653431A/en
Publication of JPS5653431A publication Critical patent/JPS5653431A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To obtain a highly credible value of measurement by a method wherein characteristics in the X-ray measurement of stress are determined, as the load stress is given to a test piece itself to be measured, and the residual stress is calculated based thereon. CONSTITUTION:To a test piece 11 of which the residual stress, etc. is measured are given a proper number of known loads and, with the loads being maintained, the X-ray measurement of stress is performed for each of them. And, the gradient of the diagram of the sin<2>psi line for each load stress is found and thereby the microscopic characteristics of the tested piece 11 in the X-ray measurement of stress at that point of time, and thus the residual stress, etc. is measured.
JP12863279A 1979-10-05 1979-10-05 Method and device for measuring stress with x-ray Pending JPS5653431A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12863279A JPS5653431A (en) 1979-10-05 1979-10-05 Method and device for measuring stress with x-ray

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12863279A JPS5653431A (en) 1979-10-05 1979-10-05 Method and device for measuring stress with x-ray

Publications (1)

Publication Number Publication Date
JPS5653431A true JPS5653431A (en) 1981-05-13

Family

ID=14989604

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12863279A Pending JPS5653431A (en) 1979-10-05 1979-10-05 Method and device for measuring stress with x-ray

Country Status (1)

Country Link
JP (1) JPS5653431A (en)

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