JPS5566764A - Automatic testing method for protection relay - Google Patents

Automatic testing method for protection relay

Info

Publication number
JPS5566764A
JPS5566764A JP10785878A JP10785878A JPS5566764A JP S5566764 A JPS5566764 A JP S5566764A JP 10785878 A JP10785878 A JP 10785878A JP 10785878 A JP10785878 A JP 10785878A JP S5566764 A JPS5566764 A JP S5566764A
Authority
JP
Japan
Prior art keywords
value
current
performance value
sample
instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10785878A
Other languages
Japanese (ja)
Inventor
Tsutomu Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP10785878A priority Critical patent/JPS5566764A/en
Publication of JPS5566764A publication Critical patent/JPS5566764A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE: To obtain possibility for carrying out tests in automatically measuring correct performance value without getting any affection from redidual magnetism by detecting performance value of device to be tested by means of semi-fine adjustment and secondary, after once intercept its current, detect performance value by fine-adjustment.
CONSTITUTION: For test sample 1 of protective relay, supplied test electric current in each level L21...L24, L23, L25...L27, controlled by computer 3, from electric source instrument 2. At testing stage set initial value of current to be applied for sample device, for example, in 90% of appointed value performance value and make test, and then change it in next stage for example, increase current 5 count in each as semi-fine adjustment value, and at the time sample instrument come into action, cut current once and let rest sample instrument 1. Then again supply less value current than performance value with which sample instrument 1 come into action, for example, 5 count less for sample instrument 1 and after that, by setting value in fine adjustment value, for example increase current 1 count in each, can get correct performance value, escaping from affection from residual magnetism.
COPYRIGHT: (C)1980,JPO&Japio
JP10785878A 1978-09-01 1978-09-01 Automatic testing method for protection relay Pending JPS5566764A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10785878A JPS5566764A (en) 1978-09-01 1978-09-01 Automatic testing method for protection relay

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10785878A JPS5566764A (en) 1978-09-01 1978-09-01 Automatic testing method for protection relay

Publications (1)

Publication Number Publication Date
JPS5566764A true JPS5566764A (en) 1980-05-20

Family

ID=14469841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10785878A Pending JPS5566764A (en) 1978-09-01 1978-09-01 Automatic testing method for protection relay

Country Status (1)

Country Link
JP (1) JPS5566764A (en)

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