JPS53133489A - Apparatus for chemical analysis - Google Patents

Apparatus for chemical analysis

Info

Publication number
JPS53133489A
JPS53133489A JP4876477A JP4876477A JPS53133489A JP S53133489 A JPS53133489 A JP S53133489A JP 4876477 A JP4876477 A JP 4876477A JP 4876477 A JP4876477 A JP 4876477A JP S53133489 A JPS53133489 A JP S53133489A
Authority
JP
Japan
Prior art keywords
chemical analysis
abnormal
occations
estimate
displaying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4876477A
Other languages
Japanese (ja)
Inventor
Toyohiko Naono
Hitoshi Hosokawa
Bunichi Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP4876477A priority Critical patent/JPS53133489A/en
Publication of JPS53133489A publication Critical patent/JPS53133489A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated

Abstract

PURPOSE:To estimate the cause of abnormal measuring results instantly by displaying the data which can check the conditions at the time of obtaining abnormal measurements immediately after such occations.
JP4876477A 1977-04-27 1977-04-27 Apparatus for chemical analysis Pending JPS53133489A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4876477A JPS53133489A (en) 1977-04-27 1977-04-27 Apparatus for chemical analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4876477A JPS53133489A (en) 1977-04-27 1977-04-27 Apparatus for chemical analysis

Publications (1)

Publication Number Publication Date
JPS53133489A true JPS53133489A (en) 1978-11-21

Family

ID=12812337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4876477A Pending JPS53133489A (en) 1977-04-27 1977-04-27 Apparatus for chemical analysis

Country Status (1)

Country Link
JP (1) JPS53133489A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56154651A (en) * 1980-05-01 1981-11-30 Olympus Optical Co Ltd Automatic analyzer
JPS56155835A (en) * 1980-05-02 1981-12-02 Olympus Optical Co Ltd Component analyzing method
JPS576343A (en) * 1980-06-13 1982-01-13 Toshiba Corp Apparatus for chemical analysis
JPS5777948A (en) * 1980-10-31 1982-05-15 Jeol Ltd Chemical analyzing method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4918395A (en) * 1972-04-17 1974-02-18

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4918395A (en) * 1972-04-17 1974-02-18

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56154651A (en) * 1980-05-01 1981-11-30 Olympus Optical Co Ltd Automatic analyzer
JPS56155835A (en) * 1980-05-02 1981-12-02 Olympus Optical Co Ltd Component analyzing method
JPH0224337B2 (en) * 1980-05-02 1990-05-29 Olympus Optical Co
JPS576343A (en) * 1980-06-13 1982-01-13 Toshiba Corp Apparatus for chemical analysis
JPS6348301B2 (en) * 1980-06-13 1988-09-28 Tokyo Shibaura Electric Co
JPS5777948A (en) * 1980-10-31 1982-05-15 Jeol Ltd Chemical analyzing method
JPS6317175B2 (en) * 1980-10-31 1988-04-12 Nippon Electron Optics Lab

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