JPS5636044A - Measuring method for ion density by fluorescent x-rays - Google Patents

Measuring method for ion density by fluorescent x-rays

Info

Publication number
JPS5636044A
JPS5636044A JP11218479A JP11218479A JPS5636044A JP S5636044 A JPS5636044 A JP S5636044A JP 11218479 A JP11218479 A JP 11218479A JP 11218479 A JP11218479 A JP 11218479A JP S5636044 A JPS5636044 A JP S5636044A
Authority
JP
Japan
Prior art keywords
density
ion
rays
relation
strength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11218479A
Other languages
Japanese (ja)
Inventor
Masakatsu Fujino
Yoshiro Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP11218479A priority Critical patent/JPS5636044A/en
Publication of JPS5636044A publication Critical patent/JPS5636044A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure rapidly and correctly each ion density in the solution in which two kinds of ion are mixed by using a combined relation of the strength of an X-ray and the ion density prepared by adopting the other ion density as a parameter. CONSTITUTION:In measurement of the solution containing Ni<2+> and Zn<2+>, for instance, a relation chart (a) is found by measuring the strength of NiKalpha rays of standard liquids whose Ni<2+> density is 0, 20, 40, 60, 80 and 100, respectively, by using the density of Zn<2+> (g/l) as a parameter, while another relation chart (b) being found under the similar conditions except for replacement of Ni<2+> with Zn<2+>. Next, a sample to be tested is measured, and, the strength of NiKalpha rays obtained being applied to the chart (a), the density of Ni<2+> (X1-X6) when the density of Zn<2+> has each of valued 0-100 is found. Then, this is indicated as a relation Y1 between Ni<2+> and Zn<2+> density, while a similar relation Y2 is indicated by using the strength of ZnKalpha rays, and an intersecting point O of Y1 and Y2 is found, thereby the density of each ion is determined (chart c).
JP11218479A 1979-08-31 1979-08-31 Measuring method for ion density by fluorescent x-rays Pending JPS5636044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11218479A JPS5636044A (en) 1979-08-31 1979-08-31 Measuring method for ion density by fluorescent x-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11218479A JPS5636044A (en) 1979-08-31 1979-08-31 Measuring method for ion density by fluorescent x-rays

Publications (1)

Publication Number Publication Date
JPS5636044A true JPS5636044A (en) 1981-04-09

Family

ID=14580349

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11218479A Pending JPS5636044A (en) 1979-08-31 1979-08-31 Measuring method for ion density by fluorescent x-rays

Country Status (1)

Country Link
JP (1) JPS5636044A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0811118A (en) * 1994-06-28 1996-01-16 Mitsubishi Material Kenzai Kk Extrusion molding machine for building material
CN1037713C (en) * 1993-09-13 1998-03-11 中国石化大庆石油化工总厂 Gold ornaments X-ray fluorescent detecting method
CN1038874C (en) * 1994-04-12 1998-06-24 中国科学院上海原子核研究所 Microarea X-ray fluorescent golden ornaments analytical device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5376093A (en) * 1976-12-17 1978-07-06 Sentrol Systems Ltd Measuring instrument

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5376093A (en) * 1976-12-17 1978-07-06 Sentrol Systems Ltd Measuring instrument

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1037713C (en) * 1993-09-13 1998-03-11 中国石化大庆石油化工总厂 Gold ornaments X-ray fluorescent detecting method
CN1038874C (en) * 1994-04-12 1998-06-24 中国科学院上海原子核研究所 Microarea X-ray fluorescent golden ornaments analytical device
JPH0811118A (en) * 1994-06-28 1996-01-16 Mitsubishi Material Kenzai Kk Extrusion molding machine for building material

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