JPS5651631A - Measuring instrument for surface temperature distribution - Google Patents
Measuring instrument for surface temperature distributionInfo
- Publication number
- JPS5651631A JPS5651631A JP12704179A JP12704179A JPS5651631A JP S5651631 A JPS5651631 A JP S5651631A JP 12704179 A JP12704179 A JP 12704179A JP 12704179 A JP12704179 A JP 12704179A JP S5651631 A JPS5651631 A JP S5651631A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- radiant heat
- surface temperature
- stored
- distribution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000126 substance Substances 0.000 abstract 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000004040 coloring Methods 0.000 abstract 1
- 239000000470 constituent Substances 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0096—Radiation pyrometry, e.g. infrared or optical thermometry for measuring wires, electrical contacts or electronic systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/025—Interfacing a pyrometer to an external device or network; User interface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/026—Control of working procedures of a pyrometer, other than calibration; Bandwidth calculation; Gain control
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/026—Means for indicating or recording specially adapted for thermometers arrangements for monitoring a plurality of temperatures, e.g. by multiplexing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/265—Contactless testing
- G01R31/2656—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Human Computer Interaction (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Radiation Pyrometers (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12704179A JPS5651631A (en) | 1979-10-02 | 1979-10-02 | Measuring instrument for surface temperature distribution |
US06/189,635 US4389125A (en) | 1979-10-02 | 1980-09-22 | Method for measuring surface temperature distribution and system |
EP80303456A EP0026673B1 (en) | 1979-10-02 | 1980-10-01 | A method for measurement of temperature distribution over the surface of a sample, and a system for performing such measurement |
DE8080303456T DE3067170D1 (en) | 1979-10-02 | 1980-10-01 | A method for measurement of temperature distribution over the surface of a sample, and a system for performing such measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12704179A JPS5651631A (en) | 1979-10-02 | 1979-10-02 | Measuring instrument for surface temperature distribution |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5651631A true JPS5651631A (en) | 1981-05-09 |
JPS636823B2 JPS636823B2 (ja) | 1988-02-12 |
Family
ID=14950160
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12704179A Granted JPS5651631A (en) | 1979-10-02 | 1979-10-02 | Measuring instrument for surface temperature distribution |
Country Status (4)
Country | Link |
---|---|
US (1) | US4389125A (ja) |
EP (1) | EP0026673B1 (ja) |
JP (1) | JPS5651631A (ja) |
DE (1) | DE3067170D1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6066122A (ja) * | 1983-09-20 | 1985-04-16 | Yamatake Honeywell Co Ltd | 放射温度計の放射率補正方法 |
JPH02234085A (ja) * | 1989-03-08 | 1990-09-17 | Mitsubishi Electric Corp | 半導体装置 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4466746A (en) * | 1981-12-01 | 1984-08-21 | Robert D. Hancock | Ebulliometric hot spot detector |
JPS6010890A (ja) * | 1983-06-29 | 1985-01-21 | Fujitsu Ltd | 画像表示方式 |
JPS60226603A (ja) * | 1984-04-24 | 1985-11-11 | バブコツク日立株式会社 | ボイラ熱応力予測装置 |
US5089700A (en) * | 1990-01-30 | 1992-02-18 | Amdata, Inc. | Apparatus for infrared imaging inspections |
US5302830A (en) * | 1993-03-05 | 1994-04-12 | General Research Corporation | Method for measuring thermal differences in infrared emissions from micro devices |
WO1998005948A1 (de) * | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren und vorrichtung zur überprüfung der inneren kühlstruktur von turbinenschaufeln, insbesondere von stationären gasturbinen |
CN105699424B (zh) * | 2016-03-03 | 2018-06-12 | 南京理工大学 | 一种mems器件残余应力温度特性的测量方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3434332A (en) * | 1965-07-26 | 1969-03-25 | Automation Ind Inc | Nondestructive tester |
US3463007A (en) * | 1967-02-27 | 1969-08-26 | North American Rockwell | Field gradient correlator system for field effect testing |
US3465150A (en) * | 1967-06-15 | 1969-09-02 | Frances Hugle | Method of aligning semiconductors |
GB1340705A (en) * | 1970-04-28 | 1973-12-12 | Lucas Industries Ltd | Apparatus for temperature measurement |
DE2330810C3 (de) * | 1972-06-20 | 1979-11-22 | Omron Tateisi Electronics Co., Kyoto (Japan) | Temperaturempfindliches Halbleiterbauelement, Verfahren zum Herstellen und zum Betrieb |
US3868508A (en) * | 1973-10-30 | 1975-02-25 | Westinghouse Electric Corp | Contactless infrared diagnostic test system |
US3991302A (en) * | 1974-11-22 | 1976-11-09 | Grumman Aerospace Corporation | Method for detecting and isolating faults in digital and analog circuits with multiple infrared scanning under conditions of different stimuli |
US4008616A (en) * | 1975-10-20 | 1977-02-22 | United States Steel Corporation | Scanning pyrometer |
US4123938A (en) * | 1976-05-19 | 1978-11-07 | University Patents, Inc. | Device for measuring thermal parameters |
US4221125A (en) * | 1979-03-09 | 1980-09-09 | Emhart Industries, Inc. | Apparatus and method for detecting the presence of a substance on a liquid surface |
US4228684A (en) * | 1979-06-04 | 1980-10-21 | General Motors Corporation | Remote temperature measuring system with semiconductor junction sensor |
-
1979
- 1979-10-02 JP JP12704179A patent/JPS5651631A/ja active Granted
-
1980
- 1980-09-22 US US06/189,635 patent/US4389125A/en not_active Expired - Lifetime
- 1980-10-01 DE DE8080303456T patent/DE3067170D1/de not_active Expired
- 1980-10-01 EP EP80303456A patent/EP0026673B1/en not_active Expired
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6066122A (ja) * | 1983-09-20 | 1985-04-16 | Yamatake Honeywell Co Ltd | 放射温度計の放射率補正方法 |
JPH02234085A (ja) * | 1989-03-08 | 1990-09-17 | Mitsubishi Electric Corp | 半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0026673A1 (en) | 1981-04-08 |
DE3067170D1 (en) | 1984-04-26 |
JPS636823B2 (ja) | 1988-02-12 |
US4389125A (en) | 1983-06-21 |
EP0026673B1 (en) | 1984-03-21 |
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