JPS5647987A - Sorting-selecting test for magnetic bubble memory chip - Google Patents

Sorting-selecting test for magnetic bubble memory chip

Info

Publication number
JPS5647987A
JPS5647987A JP12268779A JP12268779A JPS5647987A JP S5647987 A JPS5647987 A JP S5647987A JP 12268779 A JP12268779 A JP 12268779A JP 12268779 A JP12268779 A JP 12268779A JP S5647987 A JPS5647987 A JP S5647987A
Authority
JP
Japan
Prior art keywords
magnetic field
loop
defective
bubble
magnetic bubble
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12268779A
Other languages
Japanese (ja)
Inventor
Minoru Hiroshima
Kozo Hara
Akihiko Fusatani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP12268779A priority Critical patent/JPS5647987A/en
Publication of JPS5647987A publication Critical patent/JPS5647987A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To make it possible to decide securely the existence of a new-creative defective loop, by increasing the intensity of a revolving magnetic field much greater than that of the least upper bound magnetic field in memory-operation securing range for an extremely short period.
CONSTITUTION: A magnetic bubble memory chip is equipped with minor loop (m), read major line RML, write major line WML, magnetic bubble detector D, magnetic bubble generator G, replicate gate R, swap gate T, and guard rail GR. To decide the existence of a defective loop, bias magnetic field intensity HB is increased about 50% to clear bubbles and revolving magnetic field intensity HR is increased above the maximum value of value H1 under normal use condition. At the same time, a frequency in revolution is lowered. Then, the revolving magnetic field intensity and revolution frequency are returned under the normal use conditions to read information in all addresses of all minor loops, so that a loop out of which a bubble is read out will be considered to be defective.
COPYRIGHT: (C)1981,JPO&Japio
JP12268779A 1979-09-26 1979-09-26 Sorting-selecting test for magnetic bubble memory chip Pending JPS5647987A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12268779A JPS5647987A (en) 1979-09-26 1979-09-26 Sorting-selecting test for magnetic bubble memory chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12268779A JPS5647987A (en) 1979-09-26 1979-09-26 Sorting-selecting test for magnetic bubble memory chip

Publications (1)

Publication Number Publication Date
JPS5647987A true JPS5647987A (en) 1981-04-30

Family

ID=14842130

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12268779A Pending JPS5647987A (en) 1979-09-26 1979-09-26 Sorting-selecting test for magnetic bubble memory chip

Country Status (1)

Country Link
JP (1) JPS5647987A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5826379A (en) * 1981-08-07 1983-02-16 Hitachi Ltd Magnetic bubble memory device
JPS59180880A (en) * 1983-03-31 1984-10-15 Fujitsu Ltd Test method of magnetic bubble memory element

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51126733A (en) * 1975-04-25 1976-11-05 Fujitsu Ltd Bubble memory characteristic measuring method.
JPS51139737A (en) * 1975-05-29 1976-12-02 Fujitsu Ltd Measuring method for magnetic bubble devices

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51126733A (en) * 1975-04-25 1976-11-05 Fujitsu Ltd Bubble memory characteristic measuring method.
JPS51139737A (en) * 1975-05-29 1976-12-02 Fujitsu Ltd Measuring method for magnetic bubble devices

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5826379A (en) * 1981-08-07 1983-02-16 Hitachi Ltd Magnetic bubble memory device
JPS59180880A (en) * 1983-03-31 1984-10-15 Fujitsu Ltd Test method of magnetic bubble memory element

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