JPS5635473A - P-n junction type rectifying diode - Google Patents
P-n junction type rectifying diodeInfo
- Publication number
- JPS5635473A JPS5635473A JP11010679A JP11010679A JPS5635473A JP S5635473 A JPS5635473 A JP S5635473A JP 11010679 A JP11010679 A JP 11010679A JP 11010679 A JP11010679 A JP 11010679A JP S5635473 A JPS5635473 A JP S5635473A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- voltage
- type
- junction
- type layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011248 coating agent Substances 0.000 abstract 2
- 238000000576 coating method Methods 0.000 abstract 2
- 230000000717 retained effect Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/872—Schottky diodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/0814—Diodes only
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
PURPOSE:To obtain the diode which has preferable reverse characteristics and low positive voltage drop by coating a P<+> type layer in island shape on an N type layer on an N<+> type layer and coating Pt thereon. CONSTITUTION:The islandlike P<+> type layer 4 is formed on the N type epitaxial layer 2 on the N<+> type layer 1, the Pt layer 8 is deposited thereon, and a Schottky junction is formed between the layer 8 and the layer 2. Ni electrodes 5, 6 are formed respectively on the layers 1 and 8. When a voltage is appleid between the electrodes 6 and 5 and a forward voltage is applied to the P-N junction 3, the forward current will flow in parallel with the P-N junction and the Schottky junction 7. According to this configuration, electrons are injected from the layer 1 to the layer 2, while holes are injected from the layer 4, in case of flowing the forward current, a conductivity modulation occurs in the layer 2, and the resistance of the layer 2 is produced. Accordingly, a forward current will flow with sufficiently low voltage as compared with the forward voltage drop of the Schottky junction itself, and yet sufficiently high withstand voltage and low reverse current will be retained in reverse direction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11010679A JPS5635473A (en) | 1979-08-29 | 1979-08-29 | P-n junction type rectifying diode |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11010679A JPS5635473A (en) | 1979-08-29 | 1979-08-29 | P-n junction type rectifying diode |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5635473A true JPS5635473A (en) | 1981-04-08 |
Family
ID=14527184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11010679A Pending JPS5635473A (en) | 1979-08-29 | 1979-08-29 | P-n junction type rectifying diode |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5635473A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4641174A (en) * | 1983-08-08 | 1987-02-03 | General Electric Company | Pinch rectifier |
US4720734A (en) * | 1981-09-11 | 1988-01-19 | Nippon Telegraph And Telephone Public Corporation | Low loss and high speed diodes |
US4911495A (en) * | 1988-03-11 | 1990-03-27 | Honda Giken Kogyo Kabushiki Kaisha | Side sill structure for automobile |
US5017976A (en) * | 1988-12-02 | 1991-05-21 | Kabushiki Kaisha Toshiba | Semiconductor device having intermediate layer for pinching off conductive path during reverse bias application |
US5101244A (en) * | 1990-02-28 | 1992-03-31 | Hitachi, Ltd. | Semiconductor schottky device with pn regions |
US5278443A (en) * | 1990-02-28 | 1994-01-11 | Hitachi, Ltd. | Composite semiconductor device with Schottky and pn junctions |
EP0750346A1 (en) * | 1995-06-22 | 1996-12-27 | STMicroelectronics S.A. | Monolithic assembly of semiconductor components including a high-speed diode |
EP0821411A1 (en) * | 1996-07-26 | 1998-01-28 | STMicroelectronics S.A. | Monolithic assembly of an IGBT transistor and a fast diode |
CN105470314A (en) * | 2014-09-12 | 2016-04-06 | 天津职业技术师范大学 | Si/NiO:Al pn junction diode |
-
1979
- 1979-08-29 JP JP11010679A patent/JPS5635473A/en active Pending
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4720734A (en) * | 1981-09-11 | 1988-01-19 | Nippon Telegraph And Telephone Public Corporation | Low loss and high speed diodes |
US4641174A (en) * | 1983-08-08 | 1987-02-03 | General Electric Company | Pinch rectifier |
US4911495A (en) * | 1988-03-11 | 1990-03-27 | Honda Giken Kogyo Kabushiki Kaisha | Side sill structure for automobile |
US5017976A (en) * | 1988-12-02 | 1991-05-21 | Kabushiki Kaisha Toshiba | Semiconductor device having intermediate layer for pinching off conductive path during reverse bias application |
US5101244A (en) * | 1990-02-28 | 1992-03-31 | Hitachi, Ltd. | Semiconductor schottky device with pn regions |
US5278443A (en) * | 1990-02-28 | 1994-01-11 | Hitachi, Ltd. | Composite semiconductor device with Schottky and pn junctions |
EP0750346A1 (en) * | 1995-06-22 | 1996-12-27 | STMicroelectronics S.A. | Monolithic assembly of semiconductor components including a high-speed diode |
FR2735907A1 (en) * | 1995-06-22 | 1996-12-27 | Sgs Thomson Microelectronics | MONOLITIC ASSEMBLY OF SEMICONDUCTOR COMPONENTS INCLUDING A FAST DIODE |
EP0821411A1 (en) * | 1996-07-26 | 1998-01-28 | STMicroelectronics S.A. | Monolithic assembly of an IGBT transistor and a fast diode |
CN105470314A (en) * | 2014-09-12 | 2016-04-06 | 天津职业技术师范大学 | Si/NiO:Al pn junction diode |
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