JPS5632776A - Ccd image sensor - Google Patents
Ccd image sensorInfo
- Publication number
- JPS5632776A JPS5632776A JP10786279A JP10786279A JPS5632776A JP S5632776 A JPS5632776 A JP S5632776A JP 10786279 A JP10786279 A JP 10786279A JP 10786279 A JP10786279 A JP 10786279A JP S5632776 A JPS5632776 A JP S5632776A
- Authority
- JP
- Japan
- Prior art keywords
- charge
- ccd
- image sensor
- conductivity type
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 abstract 3
- 239000012535 impurity Substances 0.000 abstract 2
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14825—Linear CCD imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
PURPOSE:To contrive the reduction in dark current in the CCD image sensor by forming a charge concentration region in a channel stopper for abosrbing charge becoming noise. CONSTITUTION:There is formed the channel stopper 11 doped in large amount of impurity of the same conductivity type as the substrate to surround the portion to be formed with the image sensor of one conductivity type semiconductor substrate. There is formed the charge concentration region 12 doped with reverse conductivity type impurity to the substrate in the channel stopper 11. To the region 12 is applied a voltage forming a deeper potential than the potential of the CCD portion 5 to thus form a deep potential. When an image is picked up in this state, photocharge from a photodetector 1 is fed through a channel 4 to the CCD portion 5, and is in turn fed to the output portion 6. On the other hand, the charge oozed out of the periphery of the CCD portion 5 is attracted to the region 12, but does not enter the CCD portion 5. Accordingly, the charge transferred at the CCD portion 5 is only the photocharge containing no charge becoming noize, and a dark current can be thus remarkably reduced.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10786279A JPS5632776A (en) | 1979-08-23 | 1979-08-23 | Ccd image sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10786279A JPS5632776A (en) | 1979-08-23 | 1979-08-23 | Ccd image sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5632776A true JPS5632776A (en) | 1981-04-02 |
Family
ID=14469949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10786279A Pending JPS5632776A (en) | 1979-08-23 | 1979-08-23 | Ccd image sensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5632776A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6074475A (en) * | 1983-09-29 | 1985-04-26 | Sony Corp | Solid state image pickup element |
US6806522B2 (en) | 2000-09-28 | 2004-10-19 | Nec Electronics Corporation | CMOS image sensor and manufacturing method for the same |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4966082A (en) * | 1972-09-11 | 1974-06-26 |
-
1979
- 1979-08-23 JP JP10786279A patent/JPS5632776A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4966082A (en) * | 1972-09-11 | 1974-06-26 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6074475A (en) * | 1983-09-29 | 1985-04-26 | Sony Corp | Solid state image pickup element |
JPH0527271B2 (en) * | 1983-09-29 | 1993-04-20 | Sony Corp | |
US6806522B2 (en) | 2000-09-28 | 2004-10-19 | Nec Electronics Corporation | CMOS image sensor and manufacturing method for the same |
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