JPS56168267A - Logical device - Google Patents

Logical device

Info

Publication number
JPS56168267A
JPS56168267A JP7222280A JP7222280A JPS56168267A JP S56168267 A JPS56168267 A JP S56168267A JP 7222280 A JP7222280 A JP 7222280A JP 7222280 A JP7222280 A JP 7222280A JP S56168267 A JPS56168267 A JP S56168267A
Authority
JP
Japan
Prior art keywords
register
data
terminal
memory
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7222280A
Other languages
English (en)
Other versions
JPS6258025B2 (ja
Inventor
Koji Hashiguchi
Mitsu Takao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7222280A priority Critical patent/JPS56168267A/ja
Publication of JPS56168267A publication Critical patent/JPS56168267A/ja
Publication of JPS6258025B2 publication Critical patent/JPS6258025B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP7222280A 1980-05-30 1980-05-30 Logical device Granted JPS56168267A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7222280A JPS56168267A (en) 1980-05-30 1980-05-30 Logical device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7222280A JPS56168267A (en) 1980-05-30 1980-05-30 Logical device

Publications (2)

Publication Number Publication Date
JPS56168267A true JPS56168267A (en) 1981-12-24
JPS6258025B2 JPS6258025B2 (ja) 1987-12-03

Family

ID=13483001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7222280A Granted JPS56168267A (en) 1980-05-30 1980-05-30 Logical device

Country Status (1)

Country Link
JP (1) JPS56168267A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6432491A (en) * 1987-07-27 1989-02-02 Nippon Electric Ic Microcomput Semiconductor storage device
JPH01105400A (ja) * 1987-10-19 1989-04-21 Hitachi Ltd 半導体集積回路装置
JPH02178863A (ja) * 1988-12-29 1990-07-11 Nec Corp メモリ試験回路

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53113446A (en) * 1977-03-15 1978-10-03 Toshiba Corp Information processor and its method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53113446A (en) * 1977-03-15 1978-10-03 Toshiba Corp Information processor and its method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6432491A (en) * 1987-07-27 1989-02-02 Nippon Electric Ic Microcomput Semiconductor storage device
JPH01105400A (ja) * 1987-10-19 1989-04-21 Hitachi Ltd 半導体集積回路装置
JPH02178863A (ja) * 1988-12-29 1990-07-11 Nec Corp メモリ試験回路

Also Published As

Publication number Publication date
JPS6258025B2 (ja) 1987-12-03

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