JPS56164902A - Thickness measuring device - Google Patents

Thickness measuring device

Info

Publication number
JPS56164902A
JPS56164902A JP6845880A JP6845880A JPS56164902A JP S56164902 A JPS56164902 A JP S56164902A JP 6845880 A JP6845880 A JP 6845880A JP 6845880 A JP6845880 A JP 6845880A JP S56164902 A JPS56164902 A JP S56164902A
Authority
JP
Japan
Prior art keywords
measuring device
optical
lens
signal processing
handle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6845880A
Other languages
Japanese (ja)
Inventor
Tomotaka Marui
Yoshikazu Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd, Kawasaki Steel Corp filed Critical Furukawa Electric Co Ltd
Priority to JP6845880A priority Critical patent/JPS56164902A/en
Publication of JPS56164902A publication Critical patent/JPS56164902A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To obtain a thickness measuring device which is small in size, causes less troubles and is easy to handle by constituting the device of an imaging device which forms images, optical transmission members arranged in the thickness direction of images, and a signal processing circuits including optical transducers which are optically connected. CONSTITUTION:This is constituted of an imaging device 2 which consists of a lens 14 slidingly fitted to the inside on the opening side of a circular tubular case 12 closed on one side, and an imaging plate 16 fixed behind the lens, and a signal processing circuit 8 which consists of optical transmission members 4, such as optical fibers, arranged at one end in the thickness direction of the image formed on an imaging plate, optical transducers 6 consisting of, for example, photodiodes, opposed to the other cut faces of the respective members 4, and an arithmetic circuit 18 connected to each of the elements 6, and the circuit 18 is connected to a display device 10. Thereby, the measuring device which is small in size, is easy to handle and is safe is obtained.
JP6845880A 1980-05-23 1980-05-23 Thickness measuring device Pending JPS56164902A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6845880A JPS56164902A (en) 1980-05-23 1980-05-23 Thickness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6845880A JPS56164902A (en) 1980-05-23 1980-05-23 Thickness measuring device

Publications (1)

Publication Number Publication Date
JPS56164902A true JPS56164902A (en) 1981-12-18

Family

ID=13374265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6845880A Pending JPS56164902A (en) 1980-05-23 1980-05-23 Thickness measuring device

Country Status (1)

Country Link
JP (1) JPS56164902A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58117405A (en) * 1982-01-05 1983-07-13 Jeol Ltd Pattern measuring method
JPS59175106U (en) * 1983-05-10 1984-11-22 東邦電子株式会社 laser micrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58117405A (en) * 1982-01-05 1983-07-13 Jeol Ltd Pattern measuring method
JPS59175106U (en) * 1983-05-10 1984-11-22 東邦電子株式会社 laser micrometer

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