JPS56157823A - Light-measuring apparatus - Google Patents

Light-measuring apparatus

Info

Publication number
JPS56157823A
JPS56157823A JP6093280A JP6093280A JPS56157823A JP S56157823 A JPS56157823 A JP S56157823A JP 6093280 A JP6093280 A JP 6093280A JP 6093280 A JP6093280 A JP 6093280A JP S56157823 A JPS56157823 A JP S56157823A
Authority
JP
Japan
Prior art keywords
light
detector
wavelength range
cut
amplified
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6093280A
Other languages
English (en)
Inventor
Shuichi Inowaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP6093280A priority Critical patent/JPS56157823A/ja
Publication of JPS56157823A publication Critical patent/JPS56157823A/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/42Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/427Dual wavelengths spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
JP6093280A 1980-05-08 1980-05-08 Light-measuring apparatus Pending JPS56157823A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6093280A JPS56157823A (en) 1980-05-08 1980-05-08 Light-measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6093280A JPS56157823A (en) 1980-05-08 1980-05-08 Light-measuring apparatus

Publications (1)

Publication Number Publication Date
JPS56157823A true JPS56157823A (en) 1981-12-05

Family

ID=13156641

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6093280A Pending JPS56157823A (en) 1980-05-08 1980-05-08 Light-measuring apparatus

Country Status (1)

Country Link
JP (1) JPS56157823A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2566532A1 (fr) * 1984-06-22 1985-12-27 Elf France Detecteur de gaz par interferometrie
JPH03165226A (ja) * 1989-11-24 1991-07-17 Matsushita Electric Ind Co Ltd 光放射測定装置
JPH09101201A (ja) * 1995-06-07 1997-04-15 Santa Barbara Res Center 高分解能の差スペクトル計システム

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2566532A1 (fr) * 1984-06-22 1985-12-27 Elf France Detecteur de gaz par interferometrie
JPH03165226A (ja) * 1989-11-24 1991-07-17 Matsushita Electric Ind Co Ltd 光放射測定装置
JP2558898B2 (ja) * 1989-11-24 1996-11-27 松下電器産業株式会社 光放射測定装置
JPH09101201A (ja) * 1995-06-07 1997-04-15 Santa Barbara Res Center 高分解能の差スペクトル計システム

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