JPS56155564A - Semiconductor memory device - Google Patents

Semiconductor memory device

Info

Publication number
JPS56155564A
JPS56155564A JP5467880A JP5467880A JPS56155564A JP S56155564 A JPS56155564 A JP S56155564A JP 5467880 A JP5467880 A JP 5467880A JP 5467880 A JP5467880 A JP 5467880A JP S56155564 A JPS56155564 A JP S56155564A
Authority
JP
Japan
Prior art keywords
electrode
memory
pulse voltage
substrate
memory device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5467880A
Other languages
Japanese (ja)
Other versions
JPS5834944B2 (en
Inventor
Shigehisa Wakamatsu
Kenji Okada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP55054678A priority Critical patent/JPS5834944B2/en
Publication of JPS56155564A publication Critical patent/JPS56155564A/en
Publication of JPS5834944B2 publication Critical patent/JPS5834944B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices

Landscapes

  • Semiconductor Memories (AREA)

Abstract

PURPOSE:To obtain a semiconductor temporary memory device which appreciably increased integration density by composing a memory cell of single element. CONSTITUTION:A pulse voltage is applied across an electrode 7 in an N type substrate 1 and an electrode 6 in a P type layer 2 in the forward direction. With an electrode 5 on an SiO2 thin film 4 kept at predetermined electric potential, minor carriers injected in the substrate 1 are held and stored under the film 4. The carriers can be erased by a reverse pulse voltage for writing. Next, with the electrode 5 and the substrate 1 kept at the same electric potential by applying a reverse pulse voltage across the electrodes 6, 7, a current flows into the electrode 6 to read the memory. And memory status is held by re-injecting minor carriers after reading. In this composition, as memory is possible by one element, integration will appreciably be improved if the device is applied to IC. And a high-speed operating memory device will be obtained as the minor carriers are moved by applying forward and reverse bias to a P-N junction or a Schottky junction.
JP55054678A 1980-04-24 1980-04-24 semiconductor storage device Expired JPS5834944B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55054678A JPS5834944B2 (en) 1980-04-24 1980-04-24 semiconductor storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55054678A JPS5834944B2 (en) 1980-04-24 1980-04-24 semiconductor storage device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP7412371A Division JPS5639058B2 (en) 1971-09-21 1971-09-21

Publications (2)

Publication Number Publication Date
JPS56155564A true JPS56155564A (en) 1981-12-01
JPS5834944B2 JPS5834944B2 (en) 1983-07-29

Family

ID=12977440

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55054678A Expired JPS5834944B2 (en) 1980-04-24 1980-04-24 semiconductor storage device

Country Status (1)

Country Link
JP (1) JPS5834944B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100503936B1 (en) * 2001-08-22 2005-07-27 미쓰비시덴키 가부시키가이샤 Semiconductor device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0525296U (en) * 1991-09-05 1993-04-02 株式会社三ツ葉電機製作所 Insulation structure of furnace wall of heating furnace

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100503936B1 (en) * 2001-08-22 2005-07-27 미쓰비시덴키 가부시키가이샤 Semiconductor device

Also Published As

Publication number Publication date
JPS5834944B2 (en) 1983-07-29

Similar Documents

Publication Publication Date Title
JPS55156371A (en) Non-volatile semiconductor memory device
GB2107519A (en) Non-volatile semiconductor memory device
Tarui et al. Electrically reprogrammable nonvolatile semiconductor memory
Schroder et al. Characterization of current transport in MNOS structures with complementary tunneling emitter bipolar transistors
EP1103980A3 (en) 2-bit/cell type nonvolatile semiconductor memory
CA1092240A (en) Semiconductor memory device
DE2622307C2 (en) Integrated semiconductor memory device
GB2113004A (en) Electrically programmable non-volatile memory
JPS56155564A (en) Semiconductor memory device
JPS5470739A (en) Semiconductor memory unit
US4025910A (en) Solid-state camera employing non-volatile charge storage elements
JPS5460529A (en) Semiconductor memory circuit
JP2964412B2 (en) Non-volatile memory
JPS5574180A (en) Non-volatile memory
GB1517926A (en) Electronic stores
JPS57189391A (en) Nonvolatile semiconductor memory integrated circuit
JPS5567160A (en) Semiconductor memory storage
JPS6318864B2 (en)
JPH0226076A (en) Semiconductor device
JPS5259584A (en) Semiconductor memory device
JP2861069B2 (en) Method for driving pnpn semiconductor device
JPS6025030B2 (en) Drive method of semiconductor memory device
JPH0697696B2 (en) Non-volatile semiconductor memory device
JPS5834943B2 (en) semiconductor storage device
CA1048154A (en) Charge coupled device with reservoir for charge carriers below input electrode