JPS56155452A - Testing method for large scale integrated circuit device - Google Patents

Testing method for large scale integrated circuit device

Info

Publication number
JPS56155452A
JPS56155452A JP5901780A JP5901780A JPS56155452A JP S56155452 A JPS56155452 A JP S56155452A JP 5901780 A JP5901780 A JP 5901780A JP 5901780 A JP5901780 A JP 5901780A JP S56155452 A JPS56155452 A JP S56155452A
Authority
JP
Japan
Prior art keywords
test
mode
rom5
input
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5901780A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6160460B2 (enExample
Inventor
Osamu Nishijima
Kiyoto Ota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP5901780A priority Critical patent/JPS56155452A/ja
Publication of JPS56155452A publication Critical patent/JPS56155452A/ja
Publication of JPS6160460B2 publication Critical patent/JPS6160460B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP5901780A 1980-05-02 1980-05-02 Testing method for large scale integrated circuit device Granted JPS56155452A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5901780A JPS56155452A (en) 1980-05-02 1980-05-02 Testing method for large scale integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5901780A JPS56155452A (en) 1980-05-02 1980-05-02 Testing method for large scale integrated circuit device

Publications (2)

Publication Number Publication Date
JPS56155452A true JPS56155452A (en) 1981-12-01
JPS6160460B2 JPS6160460B2 (enExample) 1986-12-20

Family

ID=13101094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5901780A Granted JPS56155452A (en) 1980-05-02 1980-05-02 Testing method for large scale integrated circuit device

Country Status (1)

Country Link
JP (1) JPS56155452A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999269A (ja) * 1982-11-27 1984-06-07 Hitachi Ltd 大規模集積回路テスト方式
JPS59146350A (ja) * 1983-02-09 1984-08-22 Nec Corp マイクロコンピユ−タ
JPS6276756A (ja) * 1985-09-30 1987-04-08 Toshiba Corp 自己検査回路を備えた半導体装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52105743A (en) * 1976-03-02 1977-09-05 Mitsubishi Electric Corp Checking means in digital processor unit
JPS54161860A (en) * 1978-06-13 1979-12-21 Fujitsu Ltd One-chip microcomputer featuring test mode setting function

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52105743A (en) * 1976-03-02 1977-09-05 Mitsubishi Electric Corp Checking means in digital processor unit
JPS54161860A (en) * 1978-06-13 1979-12-21 Fujitsu Ltd One-chip microcomputer featuring test mode setting function

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999269A (ja) * 1982-11-27 1984-06-07 Hitachi Ltd 大規模集積回路テスト方式
JPS59146350A (ja) * 1983-02-09 1984-08-22 Nec Corp マイクロコンピユ−タ
JPS6276756A (ja) * 1985-09-30 1987-04-08 Toshiba Corp 自己検査回路を備えた半導体装置

Also Published As

Publication number Publication date
JPS6160460B2 (enExample) 1986-12-20

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