JPS56153208A - Measuring device for extent of thickness change of painted layer - Google Patents

Measuring device for extent of thickness change of painted layer

Info

Publication number
JPS56153208A
JPS56153208A JP5671480A JP5671480A JPS56153208A JP S56153208 A JPS56153208 A JP S56153208A JP 5671480 A JP5671480 A JP 5671480A JP 5671480 A JP5671480 A JP 5671480A JP S56153208 A JPS56153208 A JP S56153208A
Authority
JP
Japan
Prior art keywords
layer
extent
thickness
reflector
beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5671480A
Other languages
Japanese (ja)
Inventor
Zenichi Yasuda
Shigeru Wada
Koji Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Paint Co Ltd
Original Assignee
Nippon Paint Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Paint Co Ltd filed Critical Nippon Paint Co Ltd
Priority to JP5671480A priority Critical patent/JPS56153208A/en
Publication of JPS56153208A publication Critical patent/JPS56153208A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To ensure a simple, quick and accurate measurement for the extent of change of thickness of layer, by dividing the linear polarized light into two luminous fluxes through a semitransparent mirror and then putting one of the two luminous fluxes into a photodetector after a reflection through the sample thin layer with the other luminous flux put into a photodetector via a reflector and thus detecting a shift of the interference fringes. CONSTITUTION:The beam sent from the laser 3 is divided into two beams X and Y by a semitransparent mirror 10 via the collimator lens 4, convex lens 5, polarizing filter 7, pinhole 8 and convex lens 9. The beam X is reflected by a full-reflector 12 and put into the light receiving part 13 consisting of an photodiode array 15. On the other hand, the beam Y irradiates the areas having the 5-9mm. diameters of the painted layer 2, and this reflected light goes into the light receiving part. A shift of interference fringes caused by the interferences of both beams is displayed 20 through the amplifier 16, peak holding circuit 17, A/D converter 18 and microcomputer 19 respectively. In such way, a simple, quick and accurate measurement is possible for a change of thickness of layer.
JP5671480A 1980-04-28 1980-04-28 Measuring device for extent of thickness change of painted layer Pending JPS56153208A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5671480A JPS56153208A (en) 1980-04-28 1980-04-28 Measuring device for extent of thickness change of painted layer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5671480A JPS56153208A (en) 1980-04-28 1980-04-28 Measuring device for extent of thickness change of painted layer

Publications (1)

Publication Number Publication Date
JPS56153208A true JPS56153208A (en) 1981-11-27

Family

ID=13035142

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5671480A Pending JPS56153208A (en) 1980-04-28 1980-04-28 Measuring device for extent of thickness change of painted layer

Country Status (1)

Country Link
JP (1) JPS56153208A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58104660A (en) * 1981-12-15 1983-06-22 Matsushita Electric Works Ltd Apparatus for detecting dripping of adhesive

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58104660A (en) * 1981-12-15 1983-06-22 Matsushita Electric Works Ltd Apparatus for detecting dripping of adhesive

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