JPS5612737A - Apparatus for coating semiconductor with glass - Google Patents

Apparatus for coating semiconductor with glass

Info

Publication number
JPS5612737A
JPS5612737A JP8796379A JP8796379A JPS5612737A JP S5612737 A JPS5612737 A JP S5612737A JP 8796379 A JP8796379 A JP 8796379A JP 8796379 A JP8796379 A JP 8796379A JP S5612737 A JPS5612737 A JP S5612737A
Authority
JP
Japan
Prior art keywords
glass
disc
semiconductor
immersed
circumference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8796379A
Other languages
Japanese (ja)
Other versions
JPS596511B2 (en
Inventor
Kesamitsu Yamaguchi
Isao Ozeki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP8796379A priority Critical patent/JPS596511B2/en
Publication of JPS5612737A publication Critical patent/JPS5612737A/en
Publication of JPS596511B2 publication Critical patent/JPS596511B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To obtain the semiconductor device higher in the massproductivity and the reliability by coating the semiconductor with glass at an upper end while the side of a disc rotating on a horizontal center shaft is immersed in a glass liquid tank at a lower end. CONSTITUTION:The disc 1 for applying glass is made of synthetic resin or metal and fixed on the rotating shaft 3 directly connected to a motor 2. The disc 1 rotates in the direction of the arrow A with the side thereof sticking to the glass slurry while immersed in the slurrylike glass liquid 5 in the tank 4 at the lower end. On the top of the disc 1, the semiconductor comprising the electrode 7 and the lead wire 8 sandwitching the silicon laminated semiconductor 6 is arranged on the rail 9 parallel to the center shaft of the disc 1. The space between the upper end and the circumference of the semiconductor 6 and the electrode 7 is smaller than the thickness of the glass slurry attached on the disc side. The glass slurry 5 adheres to the circumference of the semiconductor 6 wetting it.
JP8796379A 1979-07-11 1979-07-11 Glass coating equipment for semiconductor devices Expired JPS596511B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8796379A JPS596511B2 (en) 1979-07-11 1979-07-11 Glass coating equipment for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8796379A JPS596511B2 (en) 1979-07-11 1979-07-11 Glass coating equipment for semiconductor devices

Publications (2)

Publication Number Publication Date
JPS5612737A true JPS5612737A (en) 1981-02-07
JPS596511B2 JPS596511B2 (en) 1984-02-13

Family

ID=13929505

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8796379A Expired JPS596511B2 (en) 1979-07-11 1979-07-11 Glass coating equipment for semiconductor devices

Country Status (1)

Country Link
JP (1) JPS596511B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59153615A (en) * 1983-02-23 1984-09-01 Nissan Motor Co Ltd Bonded window structure
JPS6053620U (en) * 1983-09-22 1985-04-15 マツダ株式会社 Automobile window glass mounting structure
JPH02133225A (en) * 1988-11-14 1990-05-22 Daihatsu Motor Co Ltd Window glass adhering method for automobile

Also Published As

Publication number Publication date
JPS596511B2 (en) 1984-02-13

Similar Documents

Publication Publication Date Title
FR2328967A1 (en) METHOD AND DEVICE FOR VERIFYING THE CORRECT OPERATION OF AN ELECTRIC ROTATION SPEED INDICATOR
JPS5612737A (en) Apparatus for coating semiconductor with glass
JPS6417455A (en) Semiconductor device
FR2313264A1 (en) APPARATUS FOR INDICATING THE RATE OF ICING, IN PARTICULAR ON AIRCRAFT
JPS54161270A (en) Lead frame for integrated-circuit device
BE788111A (en) METHOD AND DEVICE FOR IMPROVING THE RESISTANCE TO VIBRATIONS AND THE DAMPING REGIME IN MACHINE TOOLS
BE757378A (en) DEVICE FOR MEASURING THE FLOW SPEED OF AN ELECTRICALLY CONDUCTIVE LIQUID
FR2353649A1 (en) METHOD AND DEVICE FOR THE DEPOSIT OF REGULAR LAYERS ON SURFACE SUBSTRATES
GB2022316B (en) Method of fabricating a semiconductor device by bonding together a silicon substrate and electrodes with aluminium
JPS5670634A (en) Rotatable coating method
JPS5649534A (en) Bonding wire for semiconductor device
JPS5740943A (en) Semiconductror device
JPS55166942A (en) Semiconductor device
JPS56105670A (en) Semiconductor device
JPS523383A (en) Manufacturing method of semiconductor device electrode
JPS5753372A (en) Thermal head apparatus
JPS6325709B2 (en)
JPS57111041A (en) Semiconductor device
JPS6430235A (en) Die bonding device
JPS56116641A (en) Manufacture of semiconductor device
JPS55121668A (en) Semiconductor device
JPS5649547A (en) Manufacture of semiconductor device
JPH0314156U (en)
JPS5212588A (en) Production method of semi-conductor device
JPS5799749A (en) Semiconductor device