JPS5612730A - Electron beam exposure - Google Patents

Electron beam exposure

Info

Publication number
JPS5612730A
JPS5612730A JP8766879A JP8766879A JPS5612730A JP S5612730 A JPS5612730 A JP S5612730A JP 8766879 A JP8766879 A JP 8766879A JP 8766879 A JP8766879 A JP 8766879A JP S5612730 A JPS5612730 A JP S5612730A
Authority
JP
Japan
Prior art keywords
alignment
wafer
electron beam
marks
areas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8766879A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6152973B2 (enrdf_load_stackoverflow
Inventor
Hisayasu Nishino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP8766879A priority Critical patent/JPS5612730A/ja
Publication of JPS5612730A publication Critical patent/JPS5612730A/ja
Publication of JPS6152973B2 publication Critical patent/JPS6152973B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • H01J37/3045Object or beam position registration

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Beam Exposure (AREA)
JP8766879A 1979-07-11 1979-07-11 Electron beam exposure Granted JPS5612730A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8766879A JPS5612730A (en) 1979-07-11 1979-07-11 Electron beam exposure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8766879A JPS5612730A (en) 1979-07-11 1979-07-11 Electron beam exposure

Publications (2)

Publication Number Publication Date
JPS5612730A true JPS5612730A (en) 1981-02-07
JPS6152973B2 JPS6152973B2 (enrdf_load_stackoverflow) 1986-11-15

Family

ID=13921315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8766879A Granted JPS5612730A (en) 1979-07-11 1979-07-11 Electron beam exposure

Country Status (1)

Country Link
JP (1) JPS5612730A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5940008A (ja) * 1982-08-31 1984-03-05 ダイキン工業株式会社 締め付け具
JPS63148627A (ja) * 1986-12-12 1988-06-21 Hitachi Ltd 電子線描画装置の描画方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0372631U (enrdf_load_stackoverflow) * 1989-11-16 1991-07-23

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5940008A (ja) * 1982-08-31 1984-03-05 ダイキン工業株式会社 締め付け具
JPS63148627A (ja) * 1986-12-12 1988-06-21 Hitachi Ltd 電子線描画装置の描画方法

Also Published As

Publication number Publication date
JPS6152973B2 (enrdf_load_stackoverflow) 1986-11-15

Similar Documents

Publication Publication Date Title
EP0027497A3 (en) Lithographic electron beam device
DE3689671D1 (de) Apparat zur Umwandlung eines monofrequenten, linear polarisierten Laserstrahls in einen Strahl mit zwei orthogonal polarisierten Frequenzen.
DE3689127D1 (de) Apparat zur Umwandlung eines monofrequenten, linear polarisierten Laserstrahls in einen hochwirksamen Strahl mit zwei orthogonal polarisierten Frequenzen.
FR2297399A1 (fr) Systeme optique de mesure de dimensions ou de constantes optiques
JPS5612730A (en) Electron beam exposure
JPS566438A (en) Electron beam exposure
JPS52152172A (en) Working method of mask alignment mark holes
JPS5526620A (en) Electronic beam exposure device
JPS57148347A (en) Measurement of connection accuracy for electron beam exposure
ATE80689T1 (de) Schalungsvorrichtung.
JPS57184223A (en) Test method for deflection instrument
JPS5354479A (en) Comparative inspecting apparatus of pattern plate
JPS57194530A (en) Positioning of photomask substrate
JPS52154688A (en) Detection of faults on surface of metal plate moving at high speed
JPS6433962A (en) Linear image sensor
JPS5787130A (en) Exposure device of charged particle beam
JPS5691424A (en) Mask accuracy measuring pattern
JPS56169329A (en) Manufacture of integrated circuit
JPS57166034A (en) Positioning method
JPS51132856A (en) Bending degree discriminating device for bars
JPS5232676A (en) Pattern check system
SU1310625A1 (ru) Устройство дл разметки поверхностей изделий
JPS6480896A (en) Instrument for measuring two-dimensional distribution of radiation
JPS57193033A (en) Target mark for alignment and aligning method
JPS647043A (en) Photomask