JPS56126933A - Contactless evaluator for semiconductor - Google Patents
Contactless evaluator for semiconductorInfo
- Publication number
- JPS56126933A JPS56126933A JP3074680A JP3074680A JPS56126933A JP S56126933 A JPS56126933 A JP S56126933A JP 3074680 A JP3074680 A JP 3074680A JP 3074680 A JP3074680 A JP 3074680A JP S56126933 A JPS56126933 A JP S56126933A
- Authority
- JP
- Japan
- Prior art keywords
- secondary beam
- electrodes
- collector
- energy
- outputs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/265—Contactless testing
- G01R31/2653—Contactless testing using electron beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3074680A JPS56126933A (en) | 1980-03-11 | 1980-03-11 | Contactless evaluator for semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3074680A JPS56126933A (en) | 1980-03-11 | 1980-03-11 | Contactless evaluator for semiconductor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56126933A true JPS56126933A (en) | 1981-10-05 |
JPH0213463B2 JPH0213463B2 (ja) | 1990-04-04 |
Family
ID=12312237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3074680A Granted JPS56126933A (en) | 1980-03-11 | 1980-03-11 | Contactless evaluator for semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56126933A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60121654A (ja) * | 1983-12-02 | 1985-06-29 | Hitachi Ltd | イオンビーム装置 |
US4912052A (en) * | 1987-09-26 | 1990-03-27 | Kabushiki Kaisha Toshiba | Method of testing semiconductor elements |
FR2662543A1 (fr) * | 1990-05-22 | 1991-11-29 | Amp Inc | Assemblage pour etablir un trajet electrique separable entre une zone situee sur un substrat et une zone situee sur un autre substrat. |
WO2010064360A1 (ja) * | 2008-12-02 | 2010-06-10 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5123313A (ja) * | 1974-08-13 | 1976-02-24 | Sanyo Kokusaku Pulp Co | Nannenshinoseizoho |
JPS5320871U (ja) * | 1976-07-31 | 1978-02-22 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5320871B2 (ja) * | 1975-01-31 | 1978-06-29 |
-
1980
- 1980-03-11 JP JP3074680A patent/JPS56126933A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5123313A (ja) * | 1974-08-13 | 1976-02-24 | Sanyo Kokusaku Pulp Co | Nannenshinoseizoho |
JPS5320871U (ja) * | 1976-07-31 | 1978-02-22 |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60121654A (ja) * | 1983-12-02 | 1985-06-29 | Hitachi Ltd | イオンビーム装置 |
JPH0588502B2 (ja) * | 1983-12-02 | 1993-12-22 | Hitachi Ltd | |
US4912052A (en) * | 1987-09-26 | 1990-03-27 | Kabushiki Kaisha Toshiba | Method of testing semiconductor elements |
FR2662543A1 (fr) * | 1990-05-22 | 1991-11-29 | Amp Inc | Assemblage pour etablir un trajet electrique separable entre une zone situee sur un substrat et une zone situee sur un autre substrat. |
WO2010064360A1 (ja) * | 2008-12-02 | 2010-06-10 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置 |
JP2010135072A (ja) * | 2008-12-02 | 2010-06-17 | Hitachi High-Technologies Corp | 荷電粒子線装置 |
US8455823B2 (en) | 2008-12-02 | 2013-06-04 | Hitachi High-Technologies Corporation | Charged particle beam device |
Also Published As
Publication number | Publication date |
---|---|
JPH0213463B2 (ja) | 1990-04-04 |
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