JPS57189448A - Charged-particle analyzing device - Google Patents
Charged-particle analyzing deviceInfo
- Publication number
- JPS57189448A JPS57189448A JP56073468A JP7346881A JPS57189448A JP S57189448 A JPS57189448 A JP S57189448A JP 56073468 A JP56073468 A JP 56073468A JP 7346881 A JP7346881 A JP 7346881A JP S57189448 A JPS57189448 A JP S57189448A
- Authority
- JP
- Japan
- Prior art keywords
- lens
- mass spectrograph
- electrodes
- tetra
- constituted
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To enable a cylindrical electrostatic-energy analyzer with high energy- analyzing efficiency to be used, and increase the resolution of a mass spectrograph by providing a lens between the energy analyzer and the mass spectrograph. CONSTITUTION:A lens 3, which is constituted by placing three lens electrodes 15-17 parallel to each other, is installed in the middle of a double-cylindrical electrostatic-energy analyzer 1, which is constituted of an inner and an outer cylindrical electrodes 5 and 4 having the same central axis, and a tetra-polar mass spectrograph 2 having a tetra-polar part 14, which is constituted of two pairs of pole electrodes located on the X and the Y axes. Charged particles 10 such as secondary ions developing from a sample 9 are analyzed with the analyzer 1, and are focused on an image point 12. Then, charged particles, after passing through the image point 12, are deflected with the lens 3, and are focused on an image point 19. Since the point 19 is apart from the lens 3 and is located on the Z axis, the incidence angle of the beam of charged particles, which is incident upon the mass spectrograph 2, becomes small and is located between the electrodes of the tetra-polar part 14. Consequently, the resolution of the mass spectrograph 2 is increased.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56073468A JPS57189448A (en) | 1981-05-18 | 1981-05-18 | Charged-particle analyzing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56073468A JPS57189448A (en) | 1981-05-18 | 1981-05-18 | Charged-particle analyzing device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57189448A true JPS57189448A (en) | 1982-11-20 |
JPS645748B2 JPS645748B2 (en) | 1989-01-31 |
Family
ID=13519128
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56073468A Granted JPS57189448A (en) | 1981-05-18 | 1981-05-18 | Charged-particle analyzing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57189448A (en) |
-
1981
- 1981-05-18 JP JP56073468A patent/JPS57189448A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS645748B2 (en) | 1989-01-31 |
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