JPS55122349A - Virtual image type double convergence mass spectrometer - Google Patents

Virtual image type double convergence mass spectrometer

Info

Publication number
JPS55122349A
JPS55122349A JP2956579A JP2956579A JPS55122349A JP S55122349 A JPS55122349 A JP S55122349A JP 2956579 A JP2956579 A JP 2956579A JP 2956579 A JP2956579 A JP 2956579A JP S55122349 A JPS55122349 A JP S55122349A
Authority
JP
Japan
Prior art keywords
magnetic field
phim
electric field
phie
revolution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2956579A
Other languages
Japanese (ja)
Other versions
JPS6342373B2 (en
Inventor
Hisashi Matsuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DENSHI KAGAKU KK
Original Assignee
DENSHI KAGAKU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DENSHI KAGAKU KK filed Critical DENSHI KAGAKU KK
Priority to JP2956579A priority Critical patent/JPS55122349A/en
Publication of JPS55122349A publication Critical patent/JPS55122349A/en
Publication of JPS6342373B2 publication Critical patent/JPS6342373B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

PURPOSE:To obtain a compact device with high resolution and sensitivity by making both the angle of revolution phie of an electric field used in divergence and that phim of a convergent magnetic field have a relationship of phim 2phie. CONSTITUTION:The ion beam 2 emitted from the ion source 1 at an angle of divergence alpha is incident on the covergence electric field 5 with focal point F consisting of the conical electrodes 3 and 4 and the ion beam emitted from the electric field 5 is incident on the convergence magnetic field 6 with an inlet which is arranged in parallel with and near the outlet of the electric field 5. The collector slit I is provided at the real image point 8 of the magnetic field 6. In this case, the angle of revolution phie for the magnetic field and that of revolution phim for the magnetic field 6 satisfy the relationship of phim 2phie and phie is set to 20-30 deg.. This enables horizontal distance L between the source slit 5 and the compact slit I to be reduced and the ion beam axis of an orbit to become almost linear. This enables also the directional convergence and energy convergence conditions to be satisfied and a device with high resolution and sensitivity to be obtained.
JP2956579A 1979-03-14 1979-03-14 Virtual image type double convergence mass spectrometer Granted JPS55122349A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2956579A JPS55122349A (en) 1979-03-14 1979-03-14 Virtual image type double convergence mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2956579A JPS55122349A (en) 1979-03-14 1979-03-14 Virtual image type double convergence mass spectrometer

Publications (2)

Publication Number Publication Date
JPS55122349A true JPS55122349A (en) 1980-09-20
JPS6342373B2 JPS6342373B2 (en) 1988-08-23

Family

ID=12279643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2956579A Granted JPS55122349A (en) 1979-03-14 1979-03-14 Virtual image type double convergence mass spectrometer

Country Status (1)

Country Link
JP (1) JPS55122349A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005114702A1 (en) * 2004-05-21 2005-12-01 Jeol Ltd. Method and device for analyzing time-of-flight mass

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005114702A1 (en) * 2004-05-21 2005-12-01 Jeol Ltd. Method and device for analyzing time-of-flight mass

Also Published As

Publication number Publication date
JPS6342373B2 (en) 1988-08-23

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