JPS56122262A - Automatic test system for subscriber's line - Google Patents
Automatic test system for subscriber's lineInfo
- Publication number
- JPS56122262A JPS56122262A JP2543480A JP2543480A JPS56122262A JP S56122262 A JPS56122262 A JP S56122262A JP 2543480 A JP2543480 A JP 2543480A JP 2543480 A JP2543480 A JP 2543480A JP S56122262 A JPS56122262 A JP S56122262A
- Authority
- JP
- Japan
- Prior art keywords
- subscriber
- line
- test
- lte
- sub
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
- H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
- H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
Landscapes
- Engineering & Computer Science (AREA)
- Signal Processing (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Abstract
PURPOSE:To make the switch for test small to economize the constitution, by using the subscriber's line test slave device as the subscriber's line automatic test trunk commonly. CONSTITUTION:In the normal subscriber's line test, subscriber SUB is connected from test board LTD through subscriber's line test master device LTE-M, subscriber's line test trunk LTT, CODEC, connection line 15 of time division switch TDSW, connection line 13 of line switch LSW, subscriber's circuit LC, subscriber's line test slave device LTE-S, connection line 12 of test switch TSTSW, the connection line 10 of the subscriber's circuit, and the result obtained by testing SUB by LTE-S is transmitted to LTE-M. Meanwhile, when SUB dials the designation number of subscriber's line automatic test trunk SUBLT, SUB is connected to SUBLT through connection lines 11 and 12, LTE-S, LC, connection line 13, CODEC, and connection line 14, and thus, the subscriber is tested automatically.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2543480A JPS56122262A (en) | 1980-02-29 | 1980-02-29 | Automatic test system for subscriber's line |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2543480A JPS56122262A (en) | 1980-02-29 | 1980-02-29 | Automatic test system for subscriber's line |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56122262A true JPS56122262A (en) | 1981-09-25 |
Family
ID=12165869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2543480A Pending JPS56122262A (en) | 1980-02-29 | 1980-02-29 | Automatic test system for subscriber's line |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56122262A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60229564A (en) * | 1984-04-27 | 1985-11-14 | Nec Corp | Automatic test system for subscriber circuit |
-
1980
- 1980-02-29 JP JP2543480A patent/JPS56122262A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60229564A (en) * | 1984-04-27 | 1985-11-14 | Nec Corp | Automatic test system for subscriber circuit |
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