JPS57136850A - Fault accepting and testing system - Google Patents

Fault accepting and testing system

Info

Publication number
JPS57136850A
JPS57136850A JP2256881A JP2256881A JPS57136850A JP S57136850 A JPS57136850 A JP S57136850A JP 2256881 A JP2256881 A JP 2256881A JP 2256881 A JP2256881 A JP 2256881A JP S57136850 A JPS57136850 A JP S57136850A
Authority
JP
Japan
Prior art keywords
subscriber line
subscriber
test
time
division
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2256881A
Other languages
Japanese (ja)
Other versions
JPS6359576B2 (en
Inventor
Kunitoshi Otsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP2256881A priority Critical patent/JPS57136850A/en
Publication of JPS57136850A publication Critical patent/JPS57136850A/en
Publication of JPS6359576B2 publication Critical patent/JPS6359576B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/301—Circuit arrangements at the subscriber's side of the line

Abstract

PURPOSE:To test a subscriber line even by a time-division switchboard as well as a space-division switchboard by remote-controlling a subscriber line testing equipment at a subscriber test board through the channel of the time-division switchboard. CONSTITUTION:After a fault is accepted, an operator performs hooking operation through the calling circuit of a subscriber test board, and then a time- division switchboard holds the path of a time-division switch TDSW as it is and changes the path of a subscriber line concentraion switch LSW from a channel PATH1 in fault acceptance to a subscriber line test channel PATH2. Further, a slave-side subscriber testing equipment LTE-S is connected to a subscriber line to be tested, thus holding a test of the subscriber line in readiness. In this state, the operator controls the slave-side subscriber line testing equipment LTE-S remotedly from a subscriber test board LTC to test the subscriber line.
JP2256881A 1981-02-18 1981-02-18 Fault accepting and testing system Granted JPS57136850A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2256881A JPS57136850A (en) 1981-02-18 1981-02-18 Fault accepting and testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2256881A JPS57136850A (en) 1981-02-18 1981-02-18 Fault accepting and testing system

Publications (2)

Publication Number Publication Date
JPS57136850A true JPS57136850A (en) 1982-08-24
JPS6359576B2 JPS6359576B2 (en) 1988-11-21

Family

ID=12086471

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2256881A Granted JPS57136850A (en) 1981-02-18 1981-02-18 Fault accepting and testing system

Country Status (1)

Country Link
JP (1) JPS57136850A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171358A (en) * 1986-01-24 1987-07-28 Nec Corp Maintenance trunk system for subscriber line
JPS62202643A (en) * 1986-03-03 1987-09-07 Nec Corp Subscriber line test system
JPS62253257A (en) * 1986-04-15 1987-11-05 Fujitsu Ltd Fault accepting and processing system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171358A (en) * 1986-01-24 1987-07-28 Nec Corp Maintenance trunk system for subscriber line
JPH0473826B2 (en) * 1986-01-24 1992-11-24
JPS62202643A (en) * 1986-03-03 1987-09-07 Nec Corp Subscriber line test system
JPS62253257A (en) * 1986-04-15 1987-11-05 Fujitsu Ltd Fault accepting and processing system
JPH0420550B2 (en) * 1986-04-15 1992-04-03 Fujitsu Ltd

Also Published As

Publication number Publication date
JPS6359576B2 (en) 1988-11-21

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