JPS6359576B2 - - Google Patents

Info

Publication number
JPS6359576B2
JPS6359576B2 JP2256881A JP2256881A JPS6359576B2 JP S6359576 B2 JPS6359576 B2 JP S6359576B2 JP 2256881 A JP2256881 A JP 2256881A JP 2256881 A JP2256881 A JP 2256881A JP S6359576 B2 JPS6359576 B2 JP S6359576B2
Authority
JP
Japan
Prior art keywords
subscriber line
subscriber
line test
stand
test stand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2256881A
Other languages
Japanese (ja)
Other versions
JPS57136850A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2256881A priority Critical patent/JPS57136850A/en
Publication of JPS57136850A publication Critical patent/JPS57136850A/en
Publication of JPS6359576B2 publication Critical patent/JPS6359576B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M3/00Automatic or semi-automatic exchanges
    • H04M3/22Arrangements for supervision, monitoring or testing
    • H04M3/26Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04MTELEPHONIC COMMUNICATION
    • H04M3/00Automatic or semi-automatic exchanges
    • H04M3/22Arrangements for supervision, monitoring or testing
    • H04M3/26Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/301Circuit arrangements at the subscriber's side of the line

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Description

【発明の詳細な説明】 本発明は時分割交換方式における障害受付と加
入者線試験方式に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a fault acceptance and subscriber line testing system in a time division switching system.

従来、空間分割方式の交換機においては、加入
者の電話機とオペレータの操作する加入者線試験
台との間は全てアナログベースで接続される。そ
のためアナログベースで加入者線試験を行なう加
入者線試験機が加入者線試験台に直接接続されオ
ペレータにより障害受付後アナログベースで加入
者線試験が遂行され得る。これに対し時分割交換
方式の場合には加入者線と加入者線試験台との間
にデイジタル信号方式による時分割スイツチが介
在するために、加入者線試験台に直接アナログベ
ースで加入者線試験機を接続して前記の空間分割
方式における加入者線試験と同様にオペレータが
加入者線試験を行なうことは困難とされていた。
Conventionally, in a space division type exchange, all connections between a subscriber's telephone and a subscriber line test stand operated by an operator are made on an analog basis. Therefore, a subscriber line testing machine that performs a subscriber line test on an analog basis is directly connected to the subscriber line test stand, and an operator can perform a subscriber line test on an analog basis after a fault is detected. On the other hand, in the case of the time-division switching system, since a time-division switch using a digital signal method is interposed between the subscriber line and the subscriber line test stand, the subscriber line is transferred directly to the subscriber line test stand on an analog basis. It has been difficult for an operator to connect a testing machine and conduct a subscriber line test similar to the subscriber line test in the space division method described above.

本発明の目的は上記問題点を解決すること、す
なわち時分割交換方式においてもオペレータが障
害受付後空間分割方式における加入者線試験と同
様な操作で加入者線試験台から加入者との通話路
を保ちながら加入者線試験を遂行できるようにし
た障害受付・試験方式を提供するものである。
The purpose of the present invention is to solve the above-mentioned problems, that is, even in the time-division switching system, the operator can connect the communication path with the subscriber from the subscriber line test stand by the same operation as the subscriber line test in the space-division system after receiving a failure. This provides a failure reception/testing method that allows subscriber line testing to be performed while maintaining security.

本発明の障害受付・試験方式は、障害受付と加
入者線試験を遂行するための加入者線試験台と、
この加入者線試験台から時分割交換機を経由して
送られてくる指示に従つて加入者線試験を実行し
結果を時分割交換機を経由して上記加入者線試験
台へ送る機能と加入者線試験中の加入者電話機と
加入者線試験台との通話機能とを有するスレーブ
側加入者線試験機と、加入者線試験台からの指示
により時分割交換機の障害受付トランクと加入者
線試験台との通話路の閉成を制御するマスター側
加入者線試験機とを有し、上記加入線試験台にお
いて加入者からの障害受付後該加入者との通話を
継続して加入者線試験を実行することを特徴とす
る。
The fault reception/test method of the present invention includes a subscriber line test stand for performing fault reception and subscriber line testing;
A function that executes subscriber line tests according to instructions sent from this subscriber line test stand via the time division switch and sends the results to the above subscriber line test stand via the time division switch. A slave-side subscriber line testing machine that has a communication function between the subscriber telephone set during the line test and the subscriber line test stand, and a fault reception trunk of the time division exchange and the subscriber line test according to instructions from the subscriber line test stand. and a master side subscriber line testing machine that controls the closure of the communication path with the subscriber line test stand, and after receiving a fault from the subscriber, the subscriber line testing machine continues the call with the subscriber and performs the subscriber line test. It is characterized by carrying out.

次に図面を参照してこの発明を詳細に説明す
る。
Next, the present invention will be explained in detail with reference to the drawings.

第1図は、本発明の一実施例を示す時分割交換
系ブロツク構成図である。第1図において、加入
者線を収容する加入者回路LC、デイジタル/ア
ナログ変換回路DACおよび障害受付トランク
CPTは時分割交換機においては復数個存在する
が、説明を明確にするために1人の加入者からの
障害受付および加入者線試験を遂行するための通
話路を構成するのに最小限必要なもののみを示す
ことにする。加入者線試験台LTCは通話回路、
送受話器、ダイヤル回路、加入者線試験指示パネ
ル、試験結果表示パネル、モデム、通話路を経由
して従属(スレーブ)側加入者試験機LTE−S
をリモート制御するためのコード変換回路および
通話路を経由してスレーブ側加入者試験機から送
られてくる試験結果を表示するためのコード変換
回路から構成される。スレーブ側加入者試験機
LTE−Sは加入者試験回路、通話回路、モデム
および加入者試験台から送られてくるリモート制
御のためのコードにより上記回路を制御する制御
回路、加入者線試験結果を通話路を経由して加入
者試験台LTCへ送るためのコード変換回路とか
ら構成される。マスター側加入者試験機LTE−
Mは加入者試験台LTCからのオペレータの指示
により時分割交換機の各種トランク例えば障害受
付トランクCPTと加入者試験台LTCとの間のパ
スの閉成を制御する回路から構成され、障害受付
トランクCPTに加入者の電話機SUBから着信が
あつた場合、加入者試験台LTCに着信表示をし
加入者試験台LTCからのオペレータの指示によ
り障害受付トランクCPTと加入者試験台LTCと
の間のパスを閉成する。時分割スイツチTDSW、
加入者線集線スイツチLSW、加入者回路LC、デ
イジタル/アナログ変換回路DACおよび障害受
付トランクCPTは時分割交換機系を構成し、障
害受付に際しては加入者の電話機SUBから加入
者試験台までの通話路PATH1を閉成し障害受
付後加入者試験を開始するに際してはオペレータ
の加入者試験台LTCにおけるフツキング動作に
より加入者線試験機を加入者線試験の対象となる
加入者線に接続し加入者線試験通話路PATH2
を閉成する。
FIG. 1 is a block diagram of a time division exchange system showing one embodiment of the present invention. In Figure 1, there is a subscriber circuit LC that accommodates subscriber lines, a digital/analog conversion circuit DAC, and a failure reception trunk.
Several CPTs exist in a time-division exchange, but for the sake of clarity, the minimum number of CPTs is required to configure a communication path for receiving failures from one subscriber and performing subscriber line tests. I will only show the things. The subscriber line test stand LTC is a communication circuit,
Handset, dial circuit, subscriber line test instruction panel, test result display panel, modem, slave side subscriber test equipment LTE-S via communication path
It consists of a code conversion circuit for remote control and a code conversion circuit for displaying the test results sent from the slave side subscriber testing equipment via the communication path. Slave side subscriber test machine
LTE-S is a subscriber test circuit, a communication circuit, a modem, and a control circuit that controls the above circuits using codes for remote control sent from the subscriber test stand, and transmits the subscriber line test results via the communication path. It consists of a code conversion circuit for sending to the subscriber test stand LTC. Master side subscriber testing machine LTE−
M is composed of a circuit that controls the closure of paths between various trunks of the time division exchange, such as the fault reception trunk CPT and the subscriber test stand LTC, according to instructions from the operator from the subscriber test stand LTC. When an incoming call is received from the subscriber's telephone SUB, the incoming call is displayed on the subscriber test stand LTC and the path between the failure reception trunk CPT and the subscriber test stand LTC is established according to the operator's instructions from the subscriber test stand LTC. Close. time division switch TDSW,
The subscriber line concentrator switch LSW, subscriber circuit LC, digital/analog converter circuit DAC, and failure reception trunk CPT constitute a time division switching system, and when failure reception occurs, the communication path from the subscriber's telephone SUB to the subscriber test stand is When starting the subscriber test after closing PATH 1 and accepting the fault, the operator connects the subscriber line testing machine to the subscriber line to be tested by the hooking operation on the subscriber test stand LTC. Test call path PATH2
Close.

次に、上記実施例の動作を状態遷移にしたがつ
て説明する。まず空き(IDLE)状態とは、時分
割交換機の障害受付トランクCPTに着信のない
状態を指す。加入者の電話機から通話路PATH
1を経由して障害受付トランクCPTに着信があ
り、マスタ側加入者線試験機LTE−Mから加入
者線試験台に着信表示があると、オペレータが加
入者線試験台LTCからマスター側加入者線試験
機LTE−Mに対し障害受付トランクCPTと加入
者線試験台LTCとの間のパスの閉成を指示する
ことにより障害受付の状態となる。障害受付後オ
ペレータが加入者線試験台の通話回路においてフ
ツキングすることにより時分割交換機は、時分割
スイツチTDSWにおけるパスはそのままに保ち、
加入者線集線スイツチLSWのパスを障害受付時
の通話路PATH1から加入者線試験通話路
PATH2へ切り替え、また、スレーブ側加入者
線試験機LTE−Sを試験対象の加入者線と接続
することにより加入者線試験の状態となる。オペ
レータはこの状態においてスレーブ側加入者線試
験機LTE−Sを加入者線試験台LTCからリモー
ト操作し加入者線試験を遂行する。試験結果はス
レーブ側加入者線試験機LTE−Sから加入者線
試験通話路PATH2を経由して加入者線試験台
LTCへ送られ表示パネルに表示される。これに
よりオペレータは試験結果を加入者線試験通話路
PATH2を経由して加入者に伝え、加入者ある
いはオペレータのオンフツクにより障害受付トラ
ンクCPTは解放状態となり、一連の障害受付か
ら加入者線試験を終了する。
Next, the operation of the above embodiment will be explained in accordance with state transitions. First, the idle (IDLE) state refers to a state in which there is no incoming call on the failure reception trunk CPT of the time division switch. Call path PATH from subscriber's phone
When there is an incoming call to the failure reception trunk CPT via 1, and there is an incoming call display from the master side subscriber line testing machine LTE-M to the subscriber line testing stand, the operator sends the call from the subscriber line testing stand LTC to the master side subscriber line testing machine LTE-M. By instructing the line tester LTE-M to close the path between the failure acceptance trunk CPT and the subscriber line test stand LTC, the failure acceptance state is entered. After the failure is detected, the operator hooks the communication circuit of the subscriber line test stand, so that the time division switch maintains the path in the time division switch TDSW as it is.
Change the path of the subscriber line concentrator switch LSW from the call path PATH1 at the time of fault reception to the subscriber line test call path.
By switching to PATH2 and connecting the slave side subscriber line testing device LTE-S to the subscriber line to be tested, the subscriber line test state is entered. In this state, the operator remotely operates the slave side subscriber line tester LTE-S from the subscriber line test stand LTC to perform the subscriber line test. The test results are sent from the slave side subscriber line test machine LTE-S to the subscriber line test stand via the subscriber line test call path PATH2.
It is sent to LTC and displayed on the display panel. This allows the operator to send the test results to the subscriber line test channel.
This is communicated to the subscriber via PATH2, and the failure reception trunk CPT is set to a released state by the subscriber's or operator's on-hook, and the subscriber line test ends from a series of failure receptions.

本発明は以上説明したように、加入者線試験台
から時分割交換機の通話路を経由して加入者線試
験機をリモート制御し時分割交換機でも空間分割
交換換機と同様に加入者線試験を遂行することを
可能にできる。しかも加入者電話機からの障害受
付後、加入者とオペレータの通話路を保持したま
ま直ちに加入者線試験に移行でき迅速に処理でき
るなど加入者へのサービス向上の点においても優
れた効果がある。
As explained above, the present invention remotely controls a subscriber line test machine from a subscriber line test stand via a communication path of a time division exchange, and performs subscriber line testing in a time division exchange in the same way as in a space division exchange. can be made possible to carry out. Furthermore, after receiving a failure from a subscriber's telephone, the system can immediately proceed to a subscriber line test while maintaining the communication path between the subscriber and the operator, and has excellent effects in terms of improving service to the subscriber, such as being able to process the problem quickly.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の障害受付・試験方式の一実施
例を示す時分割交換機のブロツク図である。 LC……加入者回路、LTE−S……従属加入者
試験機、LSW……加入者線集線スイツチ、DAC
……デイジタルアナログ変換回路、TDSW……
時分割スイツチ、CPT……障害受付トランク、
LTE−M……主加入者試験機、LTC……加入者
線試験台。
FIG. 1 is a block diagram of a time division switch illustrating an embodiment of the fault acceptance/test method of the present invention. LC...Subscriber circuit, LTE-S...Subscriber test equipment, LSW...Subscriber line concentrator switch, DAC
...Digital-to-analog conversion circuit, TDSW...
Time division switch, CPT...Failure reception trunk,
LTE-M...Main subscriber test stand, LTC...Subscriber line test stand.

Claims (1)

【特許請求の範囲】 1 障害受付と加入者線試験を遂行するための加
入者線試験台と、 この加入者線試験台から時分割交換機を経由し
て送られてくる指示に従つて加入者線試験を実行
し結果を時分割交換機を経由して上記加入者線試
験台へ送る機能と加入者線試験中の加入者電話機
と加入者線試験台との通話機能とを有するスレー
ブ側加入者線試験機と、 加入者線試験台からの指示により時分割交換機
の障害受付トランクと加入者線試験台との通話路
の閉成を制御するマスター側加入者線試験機と、 を有し、上記加入線試験台において加入者からの
障害受付後該加入者との通話を継続して加入者線
試験を実行することを特徴とする障害受付・試験
方式。
[Scope of Claims] 1. A subscriber line test stand for accepting faults and performing subscriber line tests; A slave-side subscriber having a function of executing a line test and sending the result to the above-mentioned subscriber line test stand via a time division switch, and a function of communicating between the subscriber telephone set undergoing the subscriber line test and the subscriber line test stand. a master-side subscriber line testing machine that controls the closure of the communication path between the failure acceptance trunk of the time division exchange and the subscriber line testing stand according to instructions from the subscriber line testing stand; A failure reception/testing method characterized in that, after receiving a failure from a subscriber, the subscriber line test stand continues to communicate with the subscriber and executes a subscriber line test.
JP2256881A 1981-02-18 1981-02-18 Fault accepting and testing system Granted JPS57136850A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2256881A JPS57136850A (en) 1981-02-18 1981-02-18 Fault accepting and testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2256881A JPS57136850A (en) 1981-02-18 1981-02-18 Fault accepting and testing system

Publications (2)

Publication Number Publication Date
JPS57136850A JPS57136850A (en) 1982-08-24
JPS6359576B2 true JPS6359576B2 (en) 1988-11-21

Family

ID=12086471

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2256881A Granted JPS57136850A (en) 1981-02-18 1981-02-18 Fault accepting and testing system

Country Status (1)

Country Link
JP (1) JPS57136850A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62171358A (en) * 1986-01-24 1987-07-28 Nec Corp Maintenance trunk system for subscriber line
JPH0754948B2 (en) * 1986-03-03 1995-06-07 日本電気株式会社 Subscriber line test method
JPS62253257A (en) * 1986-04-15 1987-11-05 Fujitsu Ltd Fault accepting and processing system

Also Published As

Publication number Publication date
JPS57136850A (en) 1982-08-24

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