JPS56112605A - Detecting method for stain on picture of contour pattern - Google Patents

Detecting method for stain on picture of contour pattern

Info

Publication number
JPS56112605A
JPS56112605A JP1470680A JP1470680A JPS56112605A JP S56112605 A JPS56112605 A JP S56112605A JP 1470680 A JP1470680 A JP 1470680A JP 1470680 A JP1470680 A JP 1470680A JP S56112605 A JPS56112605 A JP S56112605A
Authority
JP
Japan
Prior art keywords
stains
picture
stain
point
inputted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1470680A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6336036B2 (enrdf_load_stackoverflow
Inventor
Yoshio Arai
Hiroyuki Kataoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Business Innovation Corp
Original Assignee
Fuji Xerox Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Xerox Co Ltd filed Critical Fuji Xerox Co Ltd
Priority to JP1470680A priority Critical patent/JPS56112605A/ja
Publication of JPS56112605A publication Critical patent/JPS56112605A/ja
Publication of JPS6336036B2 publication Critical patent/JPS6336036B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Character Input (AREA)
  • Image Processing (AREA)
JP1470680A 1980-02-12 1980-02-12 Detecting method for stain on picture of contour pattern Granted JPS56112605A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1470680A JPS56112605A (en) 1980-02-12 1980-02-12 Detecting method for stain on picture of contour pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1470680A JPS56112605A (en) 1980-02-12 1980-02-12 Detecting method for stain on picture of contour pattern

Publications (2)

Publication Number Publication Date
JPS56112605A true JPS56112605A (en) 1981-09-05
JPS6336036B2 JPS6336036B2 (enrdf_load_stackoverflow) 1988-07-18

Family

ID=11868609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1470680A Granted JPS56112605A (en) 1980-02-12 1980-02-12 Detecting method for stain on picture of contour pattern

Country Status (1)

Country Link
JP (1) JPS56112605A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57198852A (en) * 1981-05-30 1982-12-06 Toshiba Corp Inspecting device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS511033A (en) * 1974-06-24 1976-01-07 Hitachi Ltd 2 jigenpataanno zatsuonshorisochi
JPS52110529A (en) * 1976-03-15 1977-09-16 Toshiba Corp Noise erasing circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS511033A (en) * 1974-06-24 1976-01-07 Hitachi Ltd 2 jigenpataanno zatsuonshorisochi
JPS52110529A (en) * 1976-03-15 1977-09-16 Toshiba Corp Noise erasing circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57198852A (en) * 1981-05-30 1982-12-06 Toshiba Corp Inspecting device

Also Published As

Publication number Publication date
JPS6336036B2 (enrdf_load_stackoverflow) 1988-07-18

Similar Documents

Publication Publication Date Title
JPS57141779A (en) Character cutout system
KR850003061A (ko) 포토마스크 패턴 검사방법 및 장치
JPS56112605A (en) Detecting method for stain on picture of contour pattern
JPS5549779A (en) Standard memory take-in method
JPS5572807A (en) Electron-beam mask check unit
JPS57168105A (en) Pattern checking device
DE3277598D1 (en) Scan-out circuitry
JPS5717086A (en) Magnifying system of binary pattern
JPS54152806A (en) Noise eliminating circuit for picture process
JPS57196530A (en) Inspection of pattern
JPS5619271A (en) Original reading device
JPS56118607A (en) Inspection method for secondary negative
KR950025340A (ko) 전자레인지의 인코더 키 입력장치 및 그 장치를 이용한 인터럽트 처리방법
JPS5617543A (en) Axial ratio compensating circuit
JPS5759285A (en) Method for reading character
JPS5729187A (en) Method for detecting inclination of forms
JPS55138603A (en) Detecting system of pattern position
JPS57104363A (en) Frame pattern discriminating method
JPS5762466A (en) Original reader
JPS55164823A (en) Orthogonal projection image forming method of three-dimensional object
JPS60245089A (ja) パタ−ン２値化装置
JPS5541668A (en) Detecting method of character position
JPS5614768A (en) Original read system
JPS569871A (en) Deciding circuit for character line direction
JPS5683939A (en) Pattern testing process