JPS5610222A - Surface stress measuring instrument for transparent plastic - Google Patents

Surface stress measuring instrument for transparent plastic

Info

Publication number
JPS5610222A
JPS5610222A JP8492479A JP8492479A JPS5610222A JP S5610222 A JPS5610222 A JP S5610222A JP 8492479 A JP8492479 A JP 8492479A JP 8492479 A JP8492479 A JP 8492479A JP S5610222 A JPS5610222 A JP S5610222A
Authority
JP
Japan
Prior art keywords
plastic
surface stress
light
telescope
injection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8492479A
Other languages
Japanese (ja)
Inventor
Kan Kishii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP8492479A priority Critical patent/JPS5610222A/en
Priority to DE8080103771T priority patent/DE3071243D1/en
Priority to US06/164,496 priority patent/US4353649A/en
Priority to EP80103771A priority patent/EP0023577B1/en
Publication of JPS5610222A publication Critical patent/JPS5610222A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/18—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using photoelastic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle

Abstract

PURPOSE:To measure surface stress precisely without requiring any troublesome operation by a method wherein laser beam projected to a plastic is extracted through an injection prism, and the light is observed through a telescope. CONSTITUTION:Beds 12, 12' on which to install a laser oscillating tube 11 and a telescope 16 are supported with shafts 13, 13' on a foundation 10 over the surface of a plastic 1. A laser beam from the laser oscillating tube 11 is incident over the surface of the plastic through a condensing lens 14 and an incidence prisom 6', and a light from an injection prism 6 is observed through the telescope 16 arranged at the angle equal to an injection angle of the laser beam. Where there exists a surface stress on the plastic, an angle of the incident light extracted through the injection prism 6 changes from solid line to broken line in the illustration for optical elasticity effect due to stress, therefore surface stress of the plastic is calculated by measuring a distance (20a 20b) whereat a condensed point of the light changes through an objective lens 16'.
JP8492479A 1979-07-06 1979-07-06 Surface stress measuring instrument for transparent plastic Pending JPS5610222A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP8492479A JPS5610222A (en) 1979-07-06 1979-07-06 Surface stress measuring instrument for transparent plastic
DE8080103771T DE3071243D1 (en) 1979-07-06 1980-07-02 Surface stress measurement
US06/164,496 US4353649A (en) 1979-07-06 1980-07-02 Apparatus for surface stress measurement of glass coating and transparent plastic product
EP80103771A EP0023577B1 (en) 1979-07-06 1980-07-02 Surface stress measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8492479A JPS5610222A (en) 1979-07-06 1979-07-06 Surface stress measuring instrument for transparent plastic

Publications (1)

Publication Number Publication Date
JPS5610222A true JPS5610222A (en) 1981-02-02

Family

ID=13844240

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8492479A Pending JPS5610222A (en) 1979-07-06 1979-07-06 Surface stress measuring instrument for transparent plastic

Country Status (1)

Country Link
JP (1) JPS5610222A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63181905U (en) * 1987-05-15 1988-11-24

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937452A (en) * 1982-08-25 1984-02-29 Mitsubishi Electric Corp Multichannel microwave radiometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937452A (en) * 1982-08-25 1984-02-29 Mitsubishi Electric Corp Multichannel microwave radiometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63181905U (en) * 1987-05-15 1988-11-24

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