JPS5594149A - Reflecting type ash content meter - Google Patents

Reflecting type ash content meter

Info

Publication number
JPS5594149A
JPS5594149A JP252779A JP252779A JPS5594149A JP S5594149 A JPS5594149 A JP S5594149A JP 252779 A JP252779 A JP 252779A JP 252779 A JP252779 A JP 252779A JP S5594149 A JPS5594149 A JP S5594149A
Authority
JP
Japan
Prior art keywords
ray
ash content
article
transmitted
specific
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP252779A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6333096B2 (enrdf_load_stackoverflow
Inventor
Yoji Takeuchi
Kenji Isozaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Yokogawa Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp, Yokogawa Electric Works Ltd filed Critical Yokogawa Hokushin Electric Corp
Priority to JP252779A priority Critical patent/JPS5594149A/ja
Publication of JPS5594149A publication Critical patent/JPS5594149A/ja
Publication of JPS6333096B2 publication Critical patent/JPS6333096B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP252779A 1979-01-12 1979-01-12 Reflecting type ash content meter Granted JPS5594149A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP252779A JPS5594149A (en) 1979-01-12 1979-01-12 Reflecting type ash content meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP252779A JPS5594149A (en) 1979-01-12 1979-01-12 Reflecting type ash content meter

Publications (2)

Publication Number Publication Date
JPS5594149A true JPS5594149A (en) 1980-07-17
JPS6333096B2 JPS6333096B2 (enrdf_load_stackoverflow) 1988-07-04

Family

ID=11531844

Family Applications (1)

Application Number Title Priority Date Filing Date
JP252779A Granted JPS5594149A (en) 1979-01-12 1979-01-12 Reflecting type ash content meter

Country Status (1)

Country Link
JP (1) JPS5594149A (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57131042A (en) * 1981-02-06 1982-08-13 Yokogawa Hokushin Electric Corp X rays analyzer with automatic calibration apparatus
JPS57169663A (en) * 1981-03-20 1982-10-19 Kernforschungsz Karlsruhe Apparatus for continuously measuring element content in mineral liquid
WO1983001113A1 (en) * 1981-09-17 1983-03-31 Accuray Corp Methods and apparatus for x-ray analysis of rapidly moving multicomponent materials
US4639942A (en) * 1983-06-28 1987-01-27 Enso-Gutzeit Oy Procedure for measuring the quantity of silicon coating on paper or cardboard

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57131042A (en) * 1981-02-06 1982-08-13 Yokogawa Hokushin Electric Corp X rays analyzer with automatic calibration apparatus
JPS57169663A (en) * 1981-03-20 1982-10-19 Kernforschungsz Karlsruhe Apparatus for continuously measuring element content in mineral liquid
WO1983001113A1 (en) * 1981-09-17 1983-03-31 Accuray Corp Methods and apparatus for x-ray analysis of rapidly moving multicomponent materials
JPS58501480A (ja) * 1981-09-17 1983-09-01 アキユレイ　コ−ポレ−シヨン 迅速に動く多成分材料をｘ線分析する方法及び装置
US4815116A (en) * 1981-09-17 1989-03-21 Process Automation Business, Inc. Method and apparatus for x-ray analysis of rapidly moving multicomponent materials
US4639942A (en) * 1983-06-28 1987-01-27 Enso-Gutzeit Oy Procedure for measuring the quantity of silicon coating on paper or cardboard

Also Published As

Publication number Publication date
JPS6333096B2 (enrdf_load_stackoverflow) 1988-07-04

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