JPS5590846A - Measuring method of alloying for plated metal plate using fluorescent x-rays - Google Patents

Measuring method of alloying for plated metal plate using fluorescent x-rays

Info

Publication number
JPS5590846A
JPS5590846A JP16219878A JP16219878A JPS5590846A JP S5590846 A JPS5590846 A JP S5590846A JP 16219878 A JP16219878 A JP 16219878A JP 16219878 A JP16219878 A JP 16219878A JP S5590846 A JPS5590846 A JP S5590846A
Authority
JP
Japan
Prior art keywords
layer
alloying
metal
fluorescent
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16219878A
Other languages
Japanese (ja)
Inventor
Kouichi Tsumura
Kazuya Oshiba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP16219878A priority Critical patent/JPS5590846A/en
Publication of JPS5590846A publication Critical patent/JPS5590846A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Coating With Molten Metal (AREA)
  • Solid-Phase Diffusion Into Metallic Material Surfaces (AREA)

Abstract

PURPOSE:To make it possible to easily measure thickness of layer of alloy by irradiation radiation onto metal plated plates prior to and after the alloying treatment, and by measuring the strength of fluorescent X-rays discharged prior to and after the treatment. CONSTITUTION:There is carried out such an alloying treatment that an alloy layer is produced between a metal plate base plate and a plating layer, the alloy layer having components of constitutent element of both. In such case, radiation is applied to metal plated plates prior to and after the alloying treatments, and the intensities of the fluorescent X-rays of either the plating element or the base plate metal element discharged from the metal plated plate prior to the alloying treatment and the plated metal elements are measured. From these measured values, the thickness of the alloy layer constituting the lower layer is obtained to measure the degree of alloying. For instance, in the case where the plating layer is zinc, and the galvanized layer is converted to an iron-zinc alloy layer, it is particularly perferable to apply this method.
JP16219878A 1978-12-29 1978-12-29 Measuring method of alloying for plated metal plate using fluorescent x-rays Pending JPS5590846A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16219878A JPS5590846A (en) 1978-12-29 1978-12-29 Measuring method of alloying for plated metal plate using fluorescent x-rays

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16219878A JPS5590846A (en) 1978-12-29 1978-12-29 Measuring method of alloying for plated metal plate using fluorescent x-rays

Publications (1)

Publication Number Publication Date
JPS5590846A true JPS5590846A (en) 1980-07-09

Family

ID=15749846

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16219878A Pending JPS5590846A (en) 1978-12-29 1978-12-29 Measuring method of alloying for plated metal plate using fluorescent x-rays

Country Status (1)

Country Link
JP (1) JPS5590846A (en)

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